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    	 JEDT  2015 : International Journal of Electronic Design and Test
        
	
	   
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| Link: http://airccse.com/jedt/index.html | 
	
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				| When | N/A |          
				| Where | N/A |          
				| Submission Deadline | Jan 15, 2016 |  
                | Notification Due | Feb 15, 2016 |  
                | Final Version Due | Feb 23, 2016 |  |  |  |  |  | 
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     Call For Papers | 
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International Journal of Electronic Design and Test ( JEDT ) Call for PapersInternational Journal of Electronic Design and Test(JEDT) is a peer-reviewed, open access journal which invites original works describing the methods used to design and test electronic product hardware and supportive software. Authors from industry and academia are invited to submit their original unpublished research works on the topics listed below:  Topics of Interest :IC/module designLow-power designElectronic design automationDesign/test verificationFault modellingTest generationFault simulationDesign of testabilitySynthesis of testabilityBuilt-in self-testTest specificationsFormal verification of hardwareSimulation for verificationDesign debuggingTesting of VLSI devices printed circuit boards, and electronic systemsTesting of analog and digital electronic circuitsTesting of microprocessors, memories and signal processing devicesSOC and SIP testingMemory and FPGA test and repairDelay testingIDDQ testNovel test methodsEffectiveness of test methodsFault models and ATPG, and DPPM predictionDFT for analog/mixed signal ICs and system-on-chipDFT and BIST for digital and SoC
 Paper Submission: Authors are invited to submit papers for this journal through E-mail :  jedtjournal@yahoo.com (or) jedtjournal@airccse.com.Submissions must be original and should not have been published previously or be under consideration for publication while being evaluated for this Journal. Important Dates :
 | Submission Deadline | : | January 15, 2016 |  | Authors Notification | : | February 15, 2016 |  | Final Manuscript Due | : | February 23, 2016 |  | Publication Date | : | Determined by the Editor-in-Chief |  Related Journals : |