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IST 2016 : 2016 IEEE International Conference on Imaging Systems and Techniques


When Oct 4, 2016 - Oct 6, 2016
Where Chania, Crete, Greece
Submission Deadline Apr 14, 2016
Notification Due May 20, 2016
Final Version Due Jun 19, 2016
Categories    electrical engineering   sensors   engineering   measurement

Call For Papers

Engineers, scientists and medical professionals from industry, government, academia, and healthcare sectors who intend to bridge technology and clinical disciplines in the multidisciplinary areas of imaging, spectroscopy and medical diagnostic device industry, are invited to attend the School and interact with worldwide experts.
The objectives of IST 2016 are to explore physical, engineering, molecular, biochemical and imaging principles. It is important that these principles focus on the advancement and generation of new knowledge related to the design, development, and applications of a range of imaging and spectroscopy technologies, devices, instruments, systems, and techniques, including but not limited to:
Medical Diagnostic, Theranostics, Pharmaco-Imaging in Drugs and Medicine
• Medical diagnostics
• Translational imaging and theranostics
• Bioinformatics, immunohistochemical digital imaging
• Molecular imaging and biology, Omics, biomarkers, metabolites
• Pharmaco-imaging in drugs and medicine, drug characterization
• Image processing and pattern recognition

Imaging Devices, Modalities and Techniques
• Cameras, microscopy, spectroscopy, displays, device miniaturization
• Optical polarimetric reflectance spectroscopy, optical multispectral imaging, narrow band imaging, Raman scattering, laser acoustics, high magnification bronchovideoscopy, fluorescence and autofluorescence
• Optical coherence tomography (OCT), MRI, PET, SPECT, CT, ECT, microwave imaging, nanoimaging
• Robotics, and surgical guidance imaging
• Image processing and pattern recognition
• Emerging imaging trends

Remote Sensing
• Remote sensing, surveillance, ATR, ladars & lidars
• Autonomous aerial and underwater imaging systems
• Advanced space instruments and satellite imaging
• Sensors for aerospace applications
• Image processing and pattern recognition

Visualization, Inspection, Characterization, and Manufacturing
• Semiconductor wafers, solar cells, nanomaterials, biomaterials and composites
• Active-passive sensors and illumination technologies
• Pharmaceutical and food processing vision inspection systems
• Image processing and pattern recognition

Prospective authors should submit a 5-6 pages FULL PAPER, consisting of a complete description of the proposed technical content and applicable research results, using on-line submission system. After the review process the decision could be acceptance, minor revision or rejection. In case of revision, papers are accepted only upon condition that the changes requested by the Reviewers are satisfactorily addressed by the Authors in the final submitted papers, which will be checked by the Technical Program Committee. Final papers may be rejected if the Reviewers' remarks have not been properly addressed.

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