posted by user: dubeyhc || 1448 views || tracked by 1 users: [display]

IMS3TW 2010 : 16th International Mixed-Signals, Sensors and Systems Test Workshop

FacebookTwitterLinkedInGoogle

Link: http://ims3tw.tttc-events.org
 
When Jun 7, 2010 - Jun 9, 2010
Where La Grande Motte, France
Submission Deadline Feb 19, 2010
Notification Due Apr 9, 2010
Final Version Due May 14, 2010
Categories    power systems   power transmission   power distribution
 

Call For Papers

One and a half decades ago, the IEEE Mixed-Signal Test Workshop (IMSTW) was inaugurated as a forum focused on test and design issues related to electronic systems with digital and analog components. In view of accelerated developments in heterogeneous system design and production, IMSTW was expended in 2008 to include new topics that address test, design for test, reliability and manufacturability of today’s sensors and sensor-based systems, as well as emerging devices and systems. Renamed to include sensors and systems, IMS3TW aims to bring together a community of researchers working on the next-generation of devices, circuits and systems. This year, IMS3TW will continue to address the traditional technology spectrum of IMSTW, in particular all aspects of analog, mixed-signal, and RF testing, but with increased attention to all aspects of current design complexity (e.g., parametric variability, power consumption, temperature effects). To guaranteeing design robustness for the new generation of nanoelectronic devices, we need to exploit self-monitoring functionality (such as self-test/-calibration), allowing the circuit or system to adapt to varying circuit parameters or functional demands. The sensors focus of the workshop will highlight all aspects of built-in sensors for device adaptation, MEMS, and biomedical applications such as lab-on-chip and implantable devices.
Primary Topics of Interest include:

Test & Design for (on/off-line) Test

Verification & Design for Verification

Reliability & Design for Reliability


Monitoring/Diagnosis & Design for Debug/Diagnosis

Fault and Error Modelling & Simulation


Fault Tolerance

Pertaining to the following systems or underlying technologies:

Analog/Mixed-Signal Circuits
Biomedical Circuits & Systems

Lab-on-Chip
MEMs

RF & Wirelessly Controlled Devices


Microfluidics

Optoelectronics & Photonics


Heterogeneous Systems

Drug Delivery Microsystems


Implantable Devices

Key Dates

Submission deadline: February 19, 2010
Notification of acceptance: April 9, 2010
Camera-ready full papers: May 14, 2010

Related Resources

DATE 2021   Design, Automation and Test in Europe Conference
DPSP 2022   The 16th International Conference on Developments in Power System Protection
I-SMAC 2021   5th International Conference on I-SMAC (IoT in Social, Mobile, Analytics and Cloud)
ICC 2021   International Conference on Communications
ICAART 2022   14th International Conference on Agents and Artificial Intelligence
TORACLE 2021   The 1st International Workshop on Test Oracles
IEEE AIVR 2021   IEEE International Conference on Artificial Intelligence and Virtual Reality 2021
IMCL 2021 / MAR-EDU 2021   (Mobile) Mixed and Augmented Reality in Education - Special Session in IMCL 2021
DASFAA 2022   Database Systems for Advanced Applications
MDPI Mathematics InSysModGraph 2021   Special Issue Information Systems Modeling Based on Graph Theory