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TAIC PART 2010 : Testing: Academic and Industrial Conference - Practice and Research Techniques


When Sep 3, 2010 - Sep 5, 2010
Where Windsor, UK
Submission Deadline Apr 30, 2010
Notification Due Jun 4, 2010
Final Version Due Jun 25, 2010
Categories    software testing

Call For Papers


The Testing: Academic and Industrial Conference 2010 (TAIC PART 2010) establishes a forum for the publication of papers related to software testing and analysis. The theme of TAIC PART is transferring software testing technology from academia to industry. TAIC PART aims to forge collaborations between industry and academia. The goals of TAIC PART 2010 include the articulation of fundamental research questions in the field of software testing and analysis. TAIC PART also focuses on the practical challenges that are often faced by software developers in industry.


TAIC PART 2010 solicits papers on, but is not limited to, the following areas:

* Test Adequacy Criteria
* Test Suite Execution
* Test Coverage Monitoring
* Automated Test Data Generation
* Regression Testing
* Automated Debugging and Fault Localization
* Performance Evaluation
* Static and Dynamic Analysis
* Verification and Validation
* Software Reliability Engineering
* Model-Based Testing
* Testing and Formal Methods
* Testing and Model Checking
* Software Testing Process
* Technology Transfer

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