IEEE 19th Asian Test Symposium(ATS2010). at Shanghai University, Shanghai, China. SHERATON Hotel, December 01-04, 2010.
The Asian Test Symposium (ATS) provides an open forum for researchers and engineers from all countries of the world, especially from Asia, to exchange innovative ideas on system, board, and device testing with design, manufacturing and field considerations in mind. The official language of the symposium is English. Topics of interest include, but are not limited to: Automatic Test Generation / Fault Simulation Design for Testability / DfX Built-In Self-Test Test Data Compression Delay Testin