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IST 2010 : IEEE International Workshop on Imaging Systems and Techniques

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Link: http://ist.ieee-ims.org
 
When Jul 1, 2010 - Jul 2, 2010
Where Thessaloniki, Greece
Submission Deadline Feb 21, 2010
Notification Due Mar 10, 2010
Final Version Due May 5, 2010
Categories    image processing
 

Call For Papers

The 2010 IEEE International Conference on Imaging Systems and Techniques (IST 2010) will take place in Thessaloniki, Greece. Thessaloniki is one of the largest cities of Greece with great historical and cultural significance, and capital of the Greek region of Macedonia, owing its name to the sister of Alexander of Great named Thessaloniki. It is a major Mediterranean port city built amphitheatrically and located in the northern part of Greece in a unique geographical location surrounded by sea and mountains, in the vicinity (50 km) of the secluded peninsula of Chalkidiki where the great Greek philosopher Aristotle was born and taught. Thessaloniki is considered a cultural, touristic, industrial, commercial and political centre and a major transportation hub for the rest of southeastern Europe.

IST 2010 deals with the design, development, evaluation and applications of imaging systems, instrumentation, and measuring techniques, aimed at the enhancement of the detection and image quality. Applications for aerospace, medicine and biology, molecular imaging, metrology, ladar and lidars, radars, homeland security, and industrial imaging with emphasis on industrial tomography, corrosion imaging, and non-destructive evaluation(NDE) will be covered. The following areas will be particularly considered:

DETECTORS AND IMAGE FORMATION - design, development and characterization of high resolution electronic imaging detectors, such as optical detectors and cameras, ionizing radiation (x-rays, gamma rays) detectors, detector geometry and electrical parameters, physics, quantum efficiency, collection efficiency, semiconductor detectors, hybrid detectors, ultrasound transducers, MRI coils, phased array antenna elements, novel detection mechanisms, and image formation processes.

IMAGING SYSTEM DESIGN, INSTRUMENTATION AND MEASURING TECHNIQUES - imaging system design parameters, such as spectral response, spatial resolution, contrast resolution, temporal response, modulation transfer function (MTF), system efficiency, noise analysis, data acquisition systems, and measuring techniques. Imaging quality parameters as applied to optical imaging, Computed Tomography (CT), MRI, digital radiography, single-photon emission computed tomography (SPECT), positron emission tomography (PET), ultrasound, multi-fusion/multi-modality imaging, contrast agents, nano-imaging, nano-instrumentation imagery such as AFM, NSOM, SEM, confocal microscopy, multi-functional imaging.

LINEAR AND NONLINEAR TECHNIQUES FOR IMAGE PROCESSING - advanced image enhancement and processing algorithms, fuzzy neural and evolutionary techniques for image enhancement, noise estimation and filtering, image restoration, feature extraction, edge detection, image analysis and classification, figures of merit for assessing image quality, algorithms for image interpolation, post-processing techniques for correction of coding errors, data fusion, and high-level computer vision.

EMERGING TECHNOLOGIES - Novel imaging principles and/or concepts leading to the development of high resolution high-specificity imaging technological paradigms on areas such active/passive imaging achitectures, UV/V/NIR/IR imaging and arrays, THz imaging systems, environmental monitoring, imaging and spectroscopy, nano-imaging, quantum dots imaging, mine detection, biometric imaging, security imaging, cargo inspection, IED detection, efficient target detection, identification, discrimination techniques, defects and surface anomalies, corrosion imaging, imaging of composite structures, tomographic imaging, multi-modality imaging, microarray imaging chips, miniaturized portable imaging devices, physiological imaging, guided biopsy imaging, biomedical optics and cancer detection, optical polarimetric imaging, and advanced electromagnetic imaging techniques.

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