posted by user: ccovert || 425 views || tracked by 1 users: [display]

AUTOTESTCON 2018 : AUTOTESTCON

FacebookTwitterLinkedInGoogle

Link: http://autotestcon.com
 
When Sep 17, 2018 - Sep 20, 2018
Where National Harbor, USA
Submission Deadline Mar 16, 2018
Notification Due May 5, 2018
Final Version Due Jul 31, 2018
Categories    electrical engineeringautomati   automation   software   testing
 

Call For Papers

IEEE AUTOTESTCON 2018 will be held at the Gaylord in National Harbor, USA, September 17-20, 2018. AUTOTESTCON is the world's premier conference that brings together the military & aerospace automatic test industry and government & military acquirers and users to share new technologies, discuss innovative applications, and exhibit products and services.

Papers and session proposals are now being solicited. All submissions should cover appropriate topics dealing with system readiness in general and automatic test technology in particular. View the detailed Call for Papers and abstract specifications on the IEEE AUTOTESTCON website: http://autotestcon.com.

Topics include, but are not limited to:
Performance Based Logistics
Health Monitoring & Diagnostics
Embedded Instrumentation
Support Economics
Test & Support Management

Related Resources

IJMPICT 2018   International Journal of Managing Public Sector Information and Communication Technologies
AUTOTESTCON 2018   AUTOTESTCON
IJGTT 2018   International Journal of Game Theory and Technology
IJAB 2018   International Journal of Advances in Biology
SIPM 2018   6th International Conference on Signal Image Processing and Multimedia
ICMV--SPIE, Scopus, Ei Compendex 2018   SPIE--2018 The 11th International Conference on Machine Vision (ICMV 2018)--Scopus, Ei Compendex
Scopus-ICACR 2018   2018 2nd International Conference on Automation, Control and Robotics (ICACR 2018)
ICARCV 2018   15th International Conference on Control, Automation, Robotics and Vision
IJITMC 2018   The International Journal of Information Technology, Modeling and Computing
AITIJ 2018   Advances in Interconnect Technologies: An International Journal