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WoSAR 2017 : The 9th International Workshop on Software Aging and Rejuvenation


When Oct 23, 2017 - Oct 26, 2017
Where Toulouse, France
Submission Deadline Jul 21, 2017
Notification Due Aug 13, 2017
Final Version Due Aug 28, 2017
Categories    software aging   software rejuvenation   software reliability   dependability

Call For Papers

WoSAR: The 9th International Workshop on Software Aging and Rejuvenation
October 23-26, 2017, Toulouse, France, co-located with ISSRE 2017

Software aging is a problem of progressive degradation of performance and
dependability in computer programs, especially those executing for long
period of time.

This phenomenon has been extensively studied since more than 20 years,
as it affects many systems, from embedded devices to server software to
critical systems.

Software rejuvenation, i.e. restart of application (components/threads/task),
VMs or machines, is the most prominent approach to combat software aging.

A variety of reactive and proactive rejuvenation techniques, scheduling
plans, scope and granularity, have been proposed for different application
categories and platforms.

WoSAR is the premier international venue to discuss the recent advances and
discoveries in theoretical and practical aspects of software aging and
rejuvenation research.

Full paper submission: EXTENDED July 30, 2017
Research paper notification: August 13, 2017
Submission of camera-ready copy: August 28, 2017


This call for papers addresses all researchers and practitioners with an interest
about performance and dependability degradation of software systems.
Topics addressed in the workshop include but are not limited to:

* Progressive degradation of performability / availability /
reliability / scalability / ?ilities?in software systems.

* Modeling and characterization of the software aging

* Design and evaluation of rejuvenation techniques.

* Analysis of aging-related faults/bugs, errors, and failures.

* Software test strategies for detecting aging-related bugs.

* Monitoring and detection of software aging effects (e.g.,
memory leaks, database index fragmentation, unterminated
processes/threads, accrual of round-off errors, ...).

* New classes of software aging effects.

* Software aging and rejuvenation in Big Data and IoT Apps.

* Analytical, empirical, and experimental studies of any of the
above topics.

* Analysis of real case studies.

For all the above topics, WoSAR is a unique forum to discuss the
software aging and rejuvenation impacts on systems from different
domains of applicability such as:
Cloud computing, Mobile, Embedded, Medical, Cyber-physical,
SCADA, Smart Cities, Transportation, Telecommunication,
Military, System of systems, and others.

Authors are invited to submit high quality unpublished research
work describing the results of theoretical and experimental
software aging and rejuvenation research.

All the accepted papers will be included in the IEEE Xplore Digital

Papers must be written in English and be formatted according to
the IEEE authoring guidelines (1). Full papers should not exceed
seven pages in IEEE style. Paper submission will be done
electronically through EasyChair (2).

Distinguished papers, after further revisions and approval, will
be published in a special issue of a selected reputable journal.


Honorary General Co-Chairs:
Alberto Avritzer, Sonatype, USA
Tadashi Dohi, Hiroshima University, Japan
Kishor S. Trivedi, Duke University, USA

General Co-Chairs:
Rivalino Matias, Federal University of Uberlandia, Brazil
Hiroyuki Okamura, Hiroshima University, Japan

Program Committee Co-Chairs:
Artur Andrzejak, Heidelberg University, Germany
Jianwen Xiang, Wuhan University of Technology, China

Publication Co-Chairs:
Roberto Pietrantuono, University of Naples Federico II, Italy
Jing Zhao, Harbin Engineering University, China

Publicity Co-Chairs:
Roberto Natella, University of Naples Federico II, Italy
Vasilis Koutras, University of the Aegean, Greece
Zheng Zheng, Beihang University, China

Finance Co-Chairs:
Xiaolin Chang, Beijing Jiaotong University, China
Fumio Machida, NEC Corporation, Japan

Web Master:
Junjun Zheng, Hiroshima University, Japan


Alberto Avritzer, Sonatype, USA
Daniel Sadoc Menasch¨¦, Federal University of Rio de Janeiro, Brazil
Dong Li, China Electronic Product Reliability and Environmental Testing Research Institute (CEPREI), China
Dongdong Zhao, Wuhan University of Technology, China
Francesco Longo, University of Messina, Italy
Fumio Machida, NEC LASD, Japan
Hiroshi Yamada, Tokyo University of Agriculture and Technology, Japan
Hiroyuki Okamura, Hiroshima University, Japan
Javier Alonso, Amazon, USA
Jianwen Xiang, Wuhan University of Technology, China
Jinghui Li, Huawei Technologies Corporation, China
Kalyan Vaidyanathan, Qualcomm, USA
Katinka Wolter, Freie Universit?t Berlin, Germany
Kenji Kono, Keio University, Japan
Kumiko Tadano, NEC LASD, Japan
Laura Carnevali, University of Florence, Italy
Marco Lucio Scarpa, University of Messina, Italy
Michael Grottke, SUPERCRUNCH by GfK, Germany
Miroslaw Malek, University of Lugano, Switzerland
Pasqualina Potena, SICS Swedish ICT V?ster?s AB, Sweden
Paulo Maciel, Univ. Fed. Pernambuco, Brazil
Philipp Reinecke, Hewlett Packard Labs Bristol
Roberto Natella, Universit¨¤ di Napoli Federico II, Italy
Roberto Pietrantuono, Universit¨¤ di Napoli Federico II, Italy
Stefano Russo, Universit¨¤ di Napoli Federico II, Italy
Tadashi Dohi, Hiroshima University, Japan
Victor Nicola, University of Twente, Netherlands
Zheng Zheng, Beihang University, China
Artur Andrzejak, Universit?t Heidelberg, Germany
Rivalino Matias, Federal University of Uberlandia, Brazil
Manoj Nambiar, Tata Consultancy Services Mumbai, India


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