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VALID 2017 : The Ninth International Conference on Advances in System Testing and Validation Lifecycle

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Link: http://iaria.org/conferences2017/VALID17.html
 
When Oct 8, 2017 - Oct 12, 2017
Where Athens, Greece
Submission Deadline Jun 20, 2017
Notification Due Jul 20, 2017
Final Version Due Aug 24, 2017
Categories    system testing   vulnerability   validation   design
 

Call For Papers

Please consider to contribute to and/or forward to the appropriate groups the following opportunity to submit and publish original scientific results to:

- VALID 2017, The Ninth International Conference on Advances in System Testing and Validation Lifecycle

The submission deadline is May 20, 2017.

Authors of selected papers will be invited to submit extended article versions to one of the IARIA Journals: http://www.iariajournals.org

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============== VALID 2017 | Call for Papers ===============


CALL FOR PAPERS, TUTORIALS, PANELS


VALID 2017, The Ninth International Conference on Advances in System Testing and Validation Lifecycle

General page: http://www.iaria.org/conferences2017/VALID17.html

Submission page: http://www.iaria.org/conferences2017/SubmitVALID17.html


Event schedule: October 8 - 12, 2017- Athens, Greece


Contributions:

- regular papers [in the proceedings, digital library]

- short papers (work in progress) [in the proceedings, digital library]

- ideas: two pages [in the proceedings, digital library]

- extended abstracts: two pages [in the proceedings, digital library]

- posters: two pages [in the proceedings, digital library]

- posters: slide only [slide-deck posted at www.iaria.org]

- presentations: slide only [slide-deck posted at www.iaria.org]

- demos: two pages [posted at www.iaria.org]

- doctoral forum submissions: [in the proceedings, digital library]


Proposals for:

- mini symposia: see http://www.iaria.org/symposium.html

- workshops: see http://www.iaria.org/workshop.html

- tutorials: [slide-deck posed on www.iaria.org]

- panels: [slide-deck posed on www.iaria.org]


Submission deadline: May 20, 2017


Sponsored by IARIA, www.iaria.org

Extended versions of selected papers will be published in IARIA Journals: http://www.iariajournals.org

Print proceedings will be available via Curran Associates, Inc.: http://www.proceedings.com/9769.html

Articles will be archived in the free access ThinkMind Digital Library: http://www.thinkmind.org


The topics suggested by the conference can be discussed in term of concepts, state of the art, research, standards, implementations, running experiments, applications, and industrial case studies. Authors are invited to submit complete unpublished papers, which are not under review in any other conference or journal in the following, but not limited to, topic areas.

All tracks are open to both research and industry contributions, in terms of Regular papers, Posters, Work in progress, Technical/marketing/business presentations, Demos, Tutorials, and Panels.

Before submission, please check and comply with the editorial rules: http://www.iaria.org/editorialrules.html


VALID 2017 Topics (for topics and submission details: see CfP on the site)

Call for Papers: http://www.iaria.org/conferences2017/CfPVALID17.html

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Robust design methodologies

Designing methodologies for robust systems; Secure software techniques; Industrial real-time software; Defect avoidance; Cost models for robust systems; Design for testability; Design for reliability and variability; Design for adaptation and resilience; Design for fault-tolerance and fast recovery; Design for manufacturability, yield and reliability; Design for testability in the context of model-driven engineering

Vulnerability discovery and resolution

Vulnerability assessment; On-line error detection; Vulnerabilities in hardware security; Self-calibration; Alternative inspections; Non-intrusive vulnerability discovery methods; Embedded malware detection

Defects and Debugging

Debugging techniques; Component debug; System debug; Software debug; Hardware debug; System debug; Power-ground defects; Full-open defects in interconnecting lines; Physical defects in memories and microprocessors; Zero-defect principles

Diagnosis

Diagnosis techniques; Advances in silicon debug and diagnosis; Error diagnosis; History-based diagnosis; Multiple-defect diagnosis; Optical diagnostics; Testability and diagnosability; Diagnosis and testing in mo bile environments

System and feature testing

Test strategy for systems-in-package; Testing embedded systems; Testing high-speed systems; Testing delay and performance; Testing communication traffic and QoS/SLA metrics; Testing robustness; Software testing; Hardware testing; Supply-chain testing; Memory testing; Microprocessor testing; Mixed-signal production test; Testing multi-voltage domains; Interconnection and compatibility testing; SAT procedures for application to testing and formal verification

Testing techniques and mechanisms

Fundamentals for digital and analog testing; Emerging testing methodologies; Engineering test coverage; Designing testing suites; Statistical testing; Functional testing; Parametric testing; Defect- and data-driven testing; Automated testing; Embedded testing; Autonomous self-testing; Low cost testing; Optimized testing; Testing systems and devices; Test standards

Testing of wireless communications systems

Testing of mobile wireless communication systems; Testing of wireless sensor networks; Testing of radio-frequency identification systems; Testing of ad-hoc networks; Testing methods for emerging standards; Hardware-based prototyping of wireless communication systems; Physical layer performance verification; On-chip testing of wireless communication systems; Modeling and simulation of wireless channels; Noise characterization and validation; Case studies and industrial applications of test instruments;

Software verification and validation

High-speed interface verification and fault-analysis; Software testing theory and practice; Model-based testing; Verification metrics; Service/application specific testing; Model checking; OO software testing; Testing embedded software; Quality assurance; Empirical studies for verification and validation; Software inspection techniques; Software testing tools; New approaches for software reliability verification and validation

Quality-assessment of software architectures and legacy systems

Quality-Assessment of Software Architectures and Legacy systems; Quality-assessment of software architectures; Validation and verification of software architecture; Automatic analysis of legacy code; Strategies for isolating legacy code and improving the design quality; Metrics for evaluating architectural quality characteristics; Tools for quality assessments of software architectures; Techniques and tools for testing legacy systems

Testing and validation of run-time evolving systems

Automated testing for run-time evolving systems; Testing and validation of evolving systems; Testing and validation of self-controlled systems; Testing compile-time versus run-time dependency for evolving systems; On-line validation and testing of evolving at run-time systems; Modeling for testability of evolving at run-time systems; Near real-time and real-time monitoring of run-time evolving systems; Verification and validation of reflective models for testing; Verification and validation of fault tolerance in run-time evolving systems

Feature-oriented testing

Testing user interfaces and user-driven features; Privacy testing; Ontology accuracy testing; Testing semantic matching; Testing certification processes; Testing authentication mechanisms; Testing biometrics methodologies and mechanisms; Testing cross-nation systems; Testing system interoperability; Testing system safety; Testing system robustness; Testing temporal constraints; Testing transaction-based properties; Directed energy test capabilities /microwave, laser, etc./; Testing delay and latency metrics

Domain-oriented testing

Testing autonomic and autonomous systems; Testing intrusion prevention systems; Firewall testing; Information assurance testing; Testing social network systems; Testing recommender systems; Testing biometric systems; Testing diagnostic systems; Testing on-line systems; Testing financial systems; Testing life threatening systems; Testing emergency systems; Testing sensor-based systems; Testing testing systems


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VALID 2017 Committee: http://www.iaria.org/conferences2017/ComVALID17.html

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