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ITEQS 2017 : 1st International Workshop on Testing Extra-Functional Properties and Quality Characteristics of Software Systems


When Mar 13, 2017 - Mar 18, 2017
Where Tokyo, Japan
Submission Deadline Dec 1, 2016
Notification Due Jan 2, 2017
Categories    software testing   verification and validation   extra-functional properties   software quality

Call For Papers

1st International Workshop on Testing Extra-Functional Properties and Quality Characteristics of Software Systems (ITEQS)
Co-located with the 10th IEEE International Conference on Software Testing, Verification and Validation (ICST 2017), Tokyo - Japan


The rapid development towards increased integration of software with the social and physical world that we see today means that quality aspects such as performance, safety, security, and robustness become more important in an increasing number of the systems and devices, which we use and depend on. In this context, the success of a software product may not only depend on the logical correctness of its functions, but also on the system quality characteristics. Such system characteristics, which are referred to and captured as Extra-Functional Properties (EFPs) or Non-Functional Properties, are particularly important in resource constrained systems such as in the domains of real-time embedded and cyber-physical systems. Therefore, such systems need to be tested with a special attention to the EFPs. Testing EFPs is challenging and often requires different approaches compared to testing normal functionality. ITEQS provides a focused forum with the goal of bringing together researchers and practitioners to share ideas, identify challenges, propose solutions and techniques, and in general expand the state of the art in testing EFPs and quality characteristics of software systems and services. The workshop endorses contributions in a wide range of topics related to testing of EFPs in the form of full papers and short yet solid work-in-progress/position papers.

Note: The workshop does not accept papers that focus purely on functional testing!

- Model-based testing of EFPs; e.g., choice of modeling languages to capture EFPs and their role on testability, model-based test case generation, etc.
- Mutation-based testing for EFPs; e.g., application of mutation techniques for testing of EFPs particularly introduction of EFP-specific mutation operators
- Search-based testing techniques for EFPs
- Testability, observability, controllability and the role of the platform; e.g., how the choice of operating system can impact testability of EFPs, for instance, a real-time operating system, introducing testability mechanisms into a platform, designing - middlewares for testing of EFPs
- Empirical studies and experience reports; e.g., on the importance of testing EFPs, evaluation of testing methods, case-study and reports on project failures due to EFPs, comparison of methods and techniques
- Quality assurance, standards, and their impact on testing EFPs
- Requirements and testing EFPs; e.g., identification and generation of test oracles for EFPs from requirements, requirements for testability, traceability
- Coverage criteria in testing EFPs
- Processes and their role in testing EFPs; e.g., agile and TDD
- Fault localization for EFPs and debugging
- Formal methods, model-checking, and reasoning about EFPs
- Parallelism, Concurrency, and Testing of multicore applications
- Performance, Robustness, and Security Testing
- Testing real-time, embedded, and cyber-physical systems, and their challenges
- Testing quality characteristics of distributed, mobile, and cloud applications

Paper format: 1) full papers 6-8 pages, 2) solid work-in-progress and position papers 4 pages; in IEEE double column format.
Submission site:
Accepted papers will be published in IEEE Digital Library.

Submission deadline: December 1, 2016
Notifications: January 2, 2017
Workshop date: March 13, 2017

Mehrdad Saadatmand, SICS Swedish ICT, Västerås, Sweden (
Birgitta Lindström, University of Skövde, Sweden (
Markus Bohlin, SICS Swedish ICT, Västerås, Sweden (


Antonia Bertolino, CNR (National Research Council), Italy
Mark Harman, University College London, UK
Vahid Garousi, Hacettepe University, Turkey
Jeff Offutt, George Mason University, USA
James H. Hill, Indiana University-Purdue University Indianapolis, USA
Vittorio Cortellessa, University of L'Aquila, Italy
Mohammad Mousavi, Halmstad University, Sweden
Brian Nielsen, Aalborg University, Denmark
Robert Feldt, Blekinge Institute of Technology, Sweden
Shiva Nejati, University of Luxembourg, Luxembourg
Björn Lisper, Mälardalen University, Sweden
Hadi Hemmati, University of Manitoba, Canada
Wasif Afzal, Mälardalen University, Sweden
Tsong Yueh Chen, Swinburne University of Technology, Australia
Pasqualina Potena, SICS Swedish ICT Västerås, Sweden
Bestoun S. Ahmed, IDSIA USI-SUPSI, Switzerland

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