posted by user: aircc_cfp || 14716 views || tracked by 11 users: [display]

JEDT 2017 : International Journal of Electronic Design and Test

FacebookTwitterLinkedInGoogle

Link: http://airccse.com/jedt/index.html
 
When N/A
Where N/A
Submission Deadline Jul 15, 2017
Notification Due Aug 15, 2017
Final Version Due Aug 25, 2017
 

Call For Papers

International Journal of Electronic Design and Test(JEDT)


Call for Papers


International Journal of Electronic Design and Test(JEDT) is a peer-reviewed, open access journal which invites original works describing the methods used to design and test electronic product hardware and supportive software. Authors from industry and academia are invited to submit their original unpublished research works on the topics listed below:


Topics of Interest


  • IC/module design
  • Low-power design
  • Electronic design automation
  • Design/test verification
  • Fault modelling
  • Test generation
  • Fault simulation
  • Design of testability
  • Synthesis of testability
  • Built-in self-test
  • Test specifications
  • Formal verification of hardware
  • Simulation for verification
  • Design debugging
  • Testing of VLSI devices printed circuit boards, and electronic systems
  • Testing of analog and digital electronic circuits
  • Testing of microprocessors, memories and signal processing devices
  • SOC and SIP testing
  • Memory and FPGA test and repair
  • Delay testing
  • IDDQ test
  • Novel test methods
  • Effectiveness of test methods
  • Fault models and ATPG, and DPPM prediction
  • DFT for analog/mixed signal ICs and system-on-chip
  • DFT and BIST for digital and SoC

Paper Submission


Authors are invited to submit papers for this journal through E-mail: jedtjournal@airccse.com . Submissions must be original and should not have been published previously or be under consideration for publication while being evaluated for this Journal.


Important Dates

 


Submission Deadline:July 15, 2017
Authors Notification:August 15,2017
Final Manuscript Due: August 25,2017
Publication Date:Determined by the Editor-in-Chief

Related Journal

Related Resources

JEDT 2019   International Journal of Electronic Design and Test
ECDMO - Ei & Scopus 2020   2020 4th European Conference on Design, Modeling and Optimization (ECDMO 2020)--EI Compendex, Scopus
ASYNC 2020   26th IEEE International Symposium on Asynchronous Circuits and Systems
VLSI 2019   10th International Conference on VLSI
DATE 2020   Design, Automation, and Test in Europe
ICVR--Ei and Scopus 2020   2020 6th International Conference on Virtual Reality (ICVR 2020)--Ei Compendex, Scopus
DTS 2019   IEEE international conference on Design & Test of integrated micro & nano-Systems
EI/SCOPUS-RDA 2020   4th International Conference on Robotics: Design and Applications (RDA 2020)
ORAJ 2019   Operations Research and Applications: An International Journal
NEXTA 2020   3rd IEEE Workshop on NEXt level of Test Automation