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NSREC 2016 : IEEE Nuclear and Space Radiation Effects Conference


When Jul 11, 2016 - Jul 15, 2016
Where Portland
Submission Deadline Feb 5, 2016

Call For Papers

The 2016 IEEE Nuclear and Space Radiation Effects Conference will be held July 11 - 15 at the The Double Tree and Oregon Convention Center, Portland, Oregon. The conference features a technical program consisting of eight to ten technical sessions of contributed papers describing the latest observations in radiation effects, a Short Course on radiation effects offered on July 11, a Radiation Effects Data Workshop, and an Industrial Exhibit. The technical program includes oral and poster sessions.
Papers on nuclear and space radiation effects on electronic and photonic materials, devices, circuits, sensors, and systems, as well as semiconductor processing technology and design techniques for producing radiation-tolerant (hardened) devices and integrated circuits, will be presented at this meeting of engineers, scientists, and managers. International participation is strongly encouraged.

We are soliciting papers describing significant new findings in the following or related areas:

Basic Mechanisms of Radiation Effects in Electronic Materials and Devices

Single-Event Charge Collection Phenomena and Mechanisms
Radiation Transport, Energy Deposition and Dosimetry
Ionizing Radiation Effects
Materials and Device Effects
Displacement Damage
Processing-Induced Radiation Effects
Radiation Effects on Electronic and Photonic Devices and Circuits
Single-Event Effects
MOS, Bipolar and Advanced Technologies
Isolation Technologies, such as SOI and SOS
Optoelectronic and Optical Devices and Systems
Methods for Hardened Design and Manufacturing
Modeling of Devices, Circuits and Systems
Cryogenic or High Temperature Effects
Novel Device Structures, such as MEMs and Nanotechnologies
Space, Atmospheric, and Terrestrial Radiation Effects
Characterization and Modeling of Radiation Environments
Space Weather Events and Effects
Spacecraft Charging
Predicting and Verifying Soft Error Rates (SER)
Hardness Assurance Technology and Testing
New Testing Techniques, Guidelines and Hardness Assurance Methodology
Unique Radiation Exposure Facilities or Novel Instrumentation Methods

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