Mutation 2016 : 11th International Workshop on Mutation Analysis
Call For Papers
Mutation 2016: The 11th International Workshop on Mutation Analysis
April 10, 2016, Chicago, IL, USA
Co-located with ICST 2016
(9th Intl. Conference on Software Testing, Verification and Validation)
* About Mutation 2016 *
Mutation is acknowledged as an important way to assess the
fault-finding effectiveness of test sets. Mutation testing has mostly
been applied at the source code level, but more recently, related
ideas have also been used to test artifacts described in a
considerable variety of notations and at different levels of
abstraction. Mutation ideas are used with requirements, formal
specifications, architectural design notations, informal descriptions
(e.g. use cases) and hardware. Mutation is now established as a major
concept in software and systems V&V and uses of mutation are
increasing. The goal of the Mutation workshop is to provide a forum
for researchers and practitioners to discuss new and emerging trends
in mutation analysis. We invite submissions of both full-length and
short-length research papers as well as industry practice papers.
* Topics of interest *
- Mutation-based test adequacy criteria
(theory or practical application).
- Mutation-based test data generation.
- Higher order mutation testing.
- Novel mutation testing paradigms and applications.
- Empirical studies of mutation testing.
- Formal theoretical analysis of mutation testing.
- Comparative studies
(i.e., studies that compare mutation with other testing techniques).
- Mutation testing tools.
- Industrial experience with mutation testing.
- New mutation systems for programming languages
and for higher-level descriptive.
- Increasing the efficiency of mutation.
- Mutation for mobile, internet and cloud based systems.
- Mutation for security and reliability.
* Submissions & Publication *
Three types of papers can be submitted to the workshop:
- Full papers (10 pages): Research, case studies
- Short papers (6 pages): Research in progress, tools,
experience reports, problem descriptions, new ideas
- Industrial papers (6 pages).
Each submitted paper must conform to the IEEE format and submission
guidelines. Submissions will be evaluated according to the relevance
and originality of the work and to their ability to generate
discussions between the participants of the workshop. Each paper will
be reviewed by three reviewers, and accepted papers will be published
in the IEEE Digital Library.
* Important Dates *
Submission of full papers: January 15, 2016
Notification of acceptance: February 22, 2016
Camera Ready: March 4, 2016
Date of workshop: April 10, 2016
* Special Issue on Mutation Testing *
Authors of selected papers will be invited to submit an extended
version of their paper to a special issue on mutation testing,
published by of the Journal of Software Testing, Verification and
Reliability (STVR). The extended papers will go through the regular
review process but will be assigned at least one reviewer from the
Mutation 2016 Program Committee.
* Organization *
Rene Just, University of Washington, USA
Jens Krinke, University College London, UK
Christopher Hénard, University of Luxembourg, Luxembourg