posted by organizer: jkrinke || 788 views || tracked by 3 users: [display]

Mutation 2016 : 11th International Workshop on Mutation Analysis

FacebookTwitterLinkedInGoogle

Link: https://sites.google.com/site/mutation2016/
 
When Apr 10, 2016 - Apr 10, 2016
Where Chicago, IL, USA
Submission Deadline Jan 15, 2016
 

Call For Papers

Mutation 2016: The 11th International Workshop on Mutation Analysis
April 10, 2016, Chicago, IL, USA

https://sites.google.com/site/mutation2016/

Co-located with ICST 2016
(9th Intl. Conference on Software Testing, Verification and Validation)


* About Mutation 2016 *

Mutation is acknowledged as an important way to assess the
fault-finding effectiveness of test sets. Mutation testing has mostly
been applied at the source code level, but more recently, related
ideas have also been used to test artifacts described in a
considerable variety of notations and at different levels of
abstraction. Mutation ideas are used with requirements, formal
specifications, architectural design notations, informal descriptions
(e.g. use cases) and hardware. Mutation is now established as a major
concept in software and systems V&V and uses of mutation are
increasing. The goal of the Mutation workshop is to provide a forum
for researchers and practitioners to discuss new and emerging trends
in mutation analysis. We invite submissions of both full-length and
short-length research papers as well as industry practice papers.


* Topics of interest *

- Mutation-based test adequacy criteria
(theory or practical application).
- Mutation-based test data generation.
- Higher order mutation testing.
- Novel mutation testing paradigms and applications.
- Empirical studies of mutation testing.
- Formal theoretical analysis of mutation testing.
- Comparative studies
(i.e., studies that compare mutation with other testing techniques).
- Mutation testing tools.
- Industrial experience with mutation testing.
- New mutation systems for programming languages
and for higher-level descriptive.
- Increasing the efficiency of mutation.
- Mutation for mobile, internet and cloud based systems.
- Mutation for security and reliability.


* Submissions & Publication *

Three types of papers can be submitted to the workshop:
- Full papers (10 pages): Research, case studies
- Short papers (6 pages): Research in progress, tools,
experience reports, problem descriptions, new ideas
- Industrial papers (6 pages).

Each submitted paper must conform to the IEEE format and submission
guidelines. Submissions will be evaluated according to the relevance
and originality of the work and to their ability to generate
discussions between the participants of the workshop. Each paper will
be reviewed by three reviewers, and accepted papers will be published
in the IEEE Digital Library.


* Important Dates *

Submission of full papers: January 15, 2016
Notification of acceptance: February 22, 2016
Camera Ready: March 4, 2016
Date of workshop: April 10, 2016


* Special Issue on Mutation Testing *

Authors of selected papers will be invited to submit an extended
version of their paper to a special issue on mutation testing,
published by of the Journal of Software Testing, Verification and
Reliability (STVR). The extended papers will go through the regular
review process but will be assigned at least one reviewer from the
Mutation 2016 Program Committee.


* Organization *

Rene Just, University of Washington, USA
Jens Krinke, University College London, UK
Christopher Hénard, University of Luxembourg, Luxembourg

Related Resources

ISSTA 2018   International Symposium on Software Testing and Analysis
IEEE - ICBDA 2018   2018 IEEE 3rd International Conference on Big Data Analysis (ICBDA 2018)--IEEE Xplore and Ei Compendex
ICIAR 2018   15th International Conference on Image Analysis and Recognition
JEI IVADR 2018   Journal of Electronic Imaging Special Issue on Image and Video Analysis, Detection, and Recognition
DSA 2018   The Frontiers in Intelligent Data and Signal Analysis DSA 2018
Ei - ICBDA - IEEE 2018   2018 IEEE 3rd International Conference on Big Data Analysis (ICBDA 2018)--IEEE Xplore and Ei Compendex
TMA 2018   Network Traffic Measurement and Analysis Conference
KES 2018 PR-TAC 2018   KES Invited Session on Pattern Recognition: Trends, Applications and Challenges
IEEE--ICCCBDA--Ei and Scopus 2018   2018 the 3rd IEEE International Conference on Cloud Computing and Big Data Analysis (ICCCBDA 2018)--Ei Compendex and Scopus
ECDA 2018   European Conference on Data Analysis