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IDT 2015 : 10th IEEE International Design & Test Symposium (IDT’15)


When Dec 14, 2015 - Dec 16, 2015
Where Dead Sea, Jordan
Submission Deadline Oct 18, 2015
Notification Due Oct 30, 2015
Final Version Due Nov 13, 2015
Categories    electronic design automation   integrated circuits   design, test, reliability   embedded systems

Call For Papers

10th IEEE International Design & Test Symposium (IDT’15)
December 14-16, 2015, Dead Sea, Jordan

The International Design and Test Symposium is an IEEE-sponsored technical event devoted to exploring emerging challenges and novel concepts related to the design, test, automation, and reliability of electronic systems ranging from integrated circuits through multi-chip modules and printed circuit boards to full systems. IDT is a unique forum to discuss best practices and novel ideas in design methods, tools, test, and reliability in the Middle East and Africa (MEA) region. The Symposium is initiated by and in affiliation with the IEEE TTTC (Test Technology Technical Council) and the 2015 edition is organized and sponsored by JUST (Jordan University of Science & Technology) and AAU (Amman Arab University) in collaboration with JCP (Jordan Competitiveness Program). It is also technically sponsored by IEEE CEDA (Council on Electronic Design Automation). The official language of the conference is English. Topics of interest include but are not limited to:

Design Methods and Tools:

• IP and SOC Design
• Multiprocessor/Multi-core Systems
• Embedded Systems
• Analog, Mixed Signal and RF Design
• High Speed Circuits Design
• Design of MEMS and MOEMS
• Low Voltage and Low Power systems
• Innovative Technologies
• Real Time Systems
• Simulation, Validation & Verification
• System Specification and Modeling
• Formal Methods and Verification
• System Design/Synthesis/Optimization

Test and Reliability:

• Yield Learning
• IP and SOC Testing
• Multiprocessor/Multi-Core Systems Test
• Memory & FPGA Test & Repair
• Delay Testing
• High Speed, Analog, Mixed Signal & RF Testing
• MEMS/MOEMS Testing
• Defect and Fault Modeling
• On-line Testing / Fault Tolerance
• Fault Simulation, ATPG
• Reliability Failures/ Modeling
• Circuit Reliability
• Electronic System Reliability

Regular Submissions:

IDT’15 invites original, unpublished paper submissions. Paper submissions should be complete manuscripts, not exceeding six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format. Authors should clearly explain the significance of the work, highlight novel features and describe its current status. All submissions are to be made electronically through the IDT’15 website. Detailed instructions for submissions are to be found at the IDT’15 website. A submission will be considered as evidence that, upon acceptance, the author(s) will prepare the final camera-ready version of the paper in time for inclusion in the proceedings, and will present the paper at the conference. All papers will be taken into consideration for the IDT 2015 Best Paper Award. In addition, a set of best papers will be considered for IEEE Design & Test.

Special Session proposals:

IDT’15 solicits Special Sessions, such as (a) Hot-Topic session addressing and discussing the challenges in topics of interest to the symposium, (b) Embedded tutorials introducing and discussing topics of interest to the attendees, (c) Panels discussing visionary and/or controversial issues. Special Session proposals consist of an extended summary (up to 1500 words) as PDF file, describing the session content and format, and must be submitted electronically through the IDT’15 website.


IDT’15 will produce a Formal Proceedings of accepted papers, published by the IEEE. The proceedings will be available to all participants during the symposium.

Important deadlines:
• Paper submission: October 18, 2015
• Special sessions and tutorials proposals: October 18, 2015
• Notification of acceptance: October 30, 2015
• Camera-ready manuscript: November 13, 2015

For general information contact
Khaldoon Mhaidat (
Yervant Zorian (

For regular submission information contact
Fadi Kurdahi (

For Special sessions proposals information contact
Ozgur Sinanoglu (

Best Regards,
On behalf of the organizing committee,
2015 IEEE International Design and Test Symposium

General Co-Chairs
Yervant Zorian, Synopsys (USA)
Khaldoon Mhaidat, JUST (JO)

Vice General Co-Chairs
Hazem ElTahawy, Mentor (EG)
Rafik Makki, Global Foundries (UAE)

Honorary General Co-Chairs
Mahmoud Al-Sheyyab, JUST (JO)
Omar Al-Jarrah, AAU (JO)

Program Co-Chairs
Fadi Kurdahi, UCI (US)
Salvador Mir, TIMA (FR)
Mwaffaq Otoom, YU (JO)

Vice Program Co-Chairs
Andre Ivanov, UBC (CA)
Said Hamdioui, TU Delft (NL)
Eyad Taqieddin, JUST (JO)

Publicity Co-Chairs
Bernard Courtois, INPG (FR)
Gayane Markosyan, Synopsys (AM)
Abdulfattah Obeid, KACST (SA)
Khaldoon Abu-Gharbieh, PSUT (JO)

TTTC Liaison
C.-H Chiang, Alcatel-Lucent (USA)

Industry Liaison
Fadi Obeidat, Synopsys (USA)

Special Sessions Co-Chairs
Ozgur Sinanoglu, NYU (UAE)
Paolo Prinetto, Polito (IT)
Awni Itradat, HU (JO)

Panels Co-Chairs
Michel Renovell, LIRLL (FR)
Magdy Abadir, Freescale (US)
Smail Niar, U Valenciennes (FR)
Fadi Zghoul, JUST (JO)

Tutorials Co-Chairs
Mazen Saghir, Texas A&M (QA)
Hakim Sahib, ADI (US)
Sahel Alouneh, GJU (JO)

Proceedings & Publications Co-Chairs
Amel Chenouf, CDTA (ALG)
Raed Bani-Hani, JUST (JO)

Finance Co-Chairs
Hatem Qashoa, AAU (JO)
Mariam Jumah, JUST (JO)

Local Arrangement Co-Chairs
Manar Ha'obsh, AAU (JO)
Mariam Jumah, JUST (JO)

IT & Web Co-Chairs
Belkacem Khiter, CDTA (ALG)
Raneem Abu Husain, AAU (JO)

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