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CMI 2016 : 2016 IEEE First International Conference on Control, Measurement and Instrumentation (CMI 2016)

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Link: https://www.cmi2016india.org/
 
When Jan 8, 2016 - Jan 10, 2016
Where Kolkata, India
Submission Deadline Jun 29, 2015
Notification Due Aug 7, 2015
Final Version Due Aug 31, 2015
Categories    control   measurement   instrumentation
 

Call For Papers

CMI 2016 will be the first biennial flagship event of IEEE Joint CSS-IMS Chapter, Kolkata Section, India. This event will provide a global forum for academicians, researchers, industrial practitioners, scientists and engineers to discuss about their research endeavors, studies, findings, new ideas and concepts, contributions and developments related to the areas of control theories and applications, measurement theories and applications and instrumentation theories and applications.

CMI 2016 will comprise keynote and plenary sessions by eminent academicians, regular and poster sessions of contributed papers, special sessions and tutorial sessions. Prospective authors are invited to submit original contributory works which are not under submission anywhere else. All papers will undergo blind peer review process and the criteria for acceptance will be based on quality, originality, technical content and relevance. Accepted papers that are presented at the conference will be submitted for publication in IEEE Xplore (approval pending) and will be published in the conference proceedings with an IEEE catalog number and ISBN number. Authors are invited to submit their papers not exceeding 5 pages in IEEE format. At least one author of each accepted paper must register for the conference and present his/her paper. The topics will include but are not limited to:


Advances in Theoretical Aspects of Control, Measurement and Instrumentation (CMI)
Sensors, Transducers and Actuators
Sensor Fusion and Sensor Arrays
Robotics, Mechatronics and Electromechanical Systems
Smart Sensors and Computational Instrumentation
Sensor Networks and Internet of Things
Signal and Image Processing in Control, Measurement and Instrumentation
Vision Sensing Based Systems
VLSI,Micro and Nanotechnology in CMI
Biomedical Sensors, Signal Analysis and Health Monitoring Applications
Data Acquisition Systems and Methodologies
Virtual Measurement and Instrumentation
Application of CMI Techniques in Wireless Communication Systems
Application of CMI Techniques in Power Electronics and Drives
Power System Measurement and Control
Adaptive and Intelligent Control
Nonlinear Systems and Control
Process Control and Instrumentation
Networked and Distributed Control
Optimal and Robust Control
Control and Automation
Estimation, Modeling and Identification
Real time Systems and Embedded Systems
Multi Agent Systems
Fuzzy, Neural and Optimization Techniques in Control, Measurement and
Instrumentation
Instrumentation for Condition Monitoring
Applications of Control, Measurement and Instrumentation (Electrical, Power and
Energy, Electronic, Mechanical, Communication, Metallurgical, Chemical, Automotive,
Aerospace, Vehicular, Manufacturing, Medical etc.

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