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IWSSS 2015 : 3rd International Workshop on Systems Safety & Security

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Link: http://www.iwsss.org/2015
 
When Jun 25, 2015 - Jun 27, 2015
Where Bucharest, Romania
Submission Deadline May 20, 2015
Notification Due May 30, 2015
Final Version Due Jun 12, 2015
Categories    security   safety   systems   process control
 

Call For Papers

IWSSS 2015 is an interdisciplinary workshop and concentrates valuable knowledge from various fields of automatic control, computers and electronics. Special interest topics of the workshop are preventing, detecting and responding cyber-attacks and malware in control systems and networks by using modern approaches.
Our intention is to bring together practitioners and implementers from industry, prestigious researches from academia and young scientists and specialists. Our aim is to create an event to promote scientific research in this challenging field of systems safety and security and to let academia and industry make a strong partnership in order to develop new products and technologies.

Workshop topics:
- Systems security & safety
- Malware detection, modelling and analysis methods in control systems
- Data security and privacy in critical systems
- Real time monitoring of critical infrastructures
- Physical and logical access control
- Biometric identification of persons
- Systems security & safety with applications in automotive industry
- Intelligent sensors applied in safety and security solutions
- Wireless sensor networks security
- Signal processing and data acquisition
- Artificial intelligence used in the field of safety and security
- Automotive tracking, monitoring and surveillance solutions

IWSSS 2015 is organized in conjunction with The 7th Electronics, Computers & Artificial Intelligence International Conference - ECAI 2015. Papers from IWSSS 2013 were published in IEEE Xplore and indexed by ISI Web of Science (CPCI). Papers from IWSSS 2014 are pending indexing in IEEE Xplore.

All accepted papers will be published in the conference proceedings which will be indexed in IEEE Xplore database.

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