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MAPLE/SCALE 2013 : MAPLE/SCALE 2013 Workshop at SPLC 2013: Call for Papers


When Aug 26, 2013 - Aug 26, 2013
Where Tokyo, Japan
Submission Deadline Jun 2, 2013
Notification Due Jun 24, 2013
Final Version Due Jul 8, 2013
Categories    product lines   model-based   scalability   workshop

Call For Papers

Call for Papers

MAPLE/SCALE 2013 at SPLC 2013
Joint Workshop of
MAPLE 2013 -- 5th International Workshop on Model-driven Approaches in Software Product Line Engineering
SCALE 2013 -- 4th Workshop on Scalable Modeling Techniques for Software Product Lines

To exploit the benefits of product lines (e.g., increased productivity, shorter time to market) all SPLE activities need to be performed in an efficient and systematic manner.
One of the greatest barriers on the way to the efficient creation, handling, and evolution of product lines is the complexity and scale of the underlying artefacts. For instance, product lines (and their products) are often part of complex system structures and exhibit a high degree of interdependencies. Product line engineers struggle to manage the variability of such system structures. Various techniques have been introduced to support product line engineering, in particular for variability management and product derivation. However, due to a lack of scalability, many of these techniques cannot easily be applied for industrial product lines.
In this context, the MAPLE/SCALE workshop focuses on the application of model-driven concepts and techniques in SPLE and explores how they can help to handle product lines of realistic complexity and facilitate systematic and efficient product derivation.
The workshop particularly aims at bringing together researchers and practitioners to (1) tackle problems of practical relevance and realistic complexity and (2) allow the evaluation and refinement of conceptual results in an industry context, with a special focus on investigating scalability.

We particularly encourage research papers based on industrial experience and empirical studies, as well as papers, which identify and structure open challenges and research questions. We are interested in all topics related to model-driven techniques and scalability issues in SPLE. Topics include, but are not limited to:
Modelling SPLs and Variability
Scalability issues
­ Statements of problems and challenges for scalability in SPLE
­ Scalability issues in industry
Product derivation/configuration
­ Assembly/Generation of products
­ Non-functional properties
Handling of large and complex SPLs
­ Scalability of model-based SPLE techniques
Visualisation and interactive techniques for SPLE
Model-based approaches to computation-ally complex SPLE problems
Feature-oriented approaches for modelling and implementation
­ Feature dependencies and feature interactions, feature location
Mapping problem-oriented concepts to solution-oriented artefacts, traceability
Evolution and Change
­ Model maintenance (merging, conflict resolution)
­ Co-evolution of models and artefacts
Reverse engineering and mining of SPL models from existing artefacts
Variability-aware techniques, e.g., for validation and verification
Integration of heterogeneous modelling languages and techniques
Runtime-variability, dynamic SPLs, variability in adaptive systems
Collaborative and distributed SPLs
­ Multi-stakeholder, multi-disciplinary environments
­ Multi product lines, software ecosystems
Non-technical issues around model-based SPLE and scalability
­ Management issues
­ Economic issues
­ Variability modelling "culture" and mindset of stakeholders
Tools and environments

We are seeking for research papers, experience reports (4-8 pages) as well as position and vision papers (4 pages max) in ACM SIG Alternative Proceedings Style. Submissions will be selected based on the relevance to the workshop topics and the suitability to trigger discussions. Papers should be submitted as PDF files:

Deadline for submissions: June 2 (extended!)
Notification of acceptance: June 24
Camera-ready version due: July 8


M. Ali Babar, Lancaster Univ., UK
Eduardo Almeida, Federal U. Bahia and RiSE, BR
David Benavides, Univ. of Seville, ES
Laurence Duchien, Univ. of Lille & INRIA, FR
Christoph Elsner, Siemens CT, DE
Yuzo Ishida, Nomura Research Institute, JP
Tomoji Kishi, Waseda Univ., JP
Jaejoon Lee, Univ. of Lancaster, UK
Takashi Maki, Ricoh, JP
Tsuneo Nakanishi, Kyushu Univ., JP
Makoto Nonaka, Toyo Univ., JP
Gilles Perrouin, Univ. of Namur, BE
Klaus Pohl, Univ. of Duisburg-Essen, DE
Andreas Pleuss, Lero, Univ. of Limerick, IE
Julia Rubin, IBM Research, Haifa, IL
Andreas Rummler, SAP Research, DE
Steffen Thiel, Furtwangen U. of Appl. Sc., DE
Frank van der Linden, Philips Healthcare, NL
Markus Voelter, Independent consultant, DE
Andrzej Wasoswki, IT Univ. of Copenhagen, DK
... and the workshop organizers

Goetz Botterweck, Lero, IE
Deepak Dhungana, Siemens CT, AT
Natsuko Noda, Shibaura Institute of Technology, JP
Rick Rabiser, JKU Linz, AT
Hironori Washizaki, Waseda University, JP

For additional information see

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