posted by system || 6356 views || tracked by 38 users: [display]

VTS 2013 : IEEE 31st VLSI Test Symposium

FacebookTwitterLinkedInGoogle


Conference Series : VLSI Test Symposium
 
Link: http://www.tttc-vts.org
 
When Apr 29, 2013 - May 2, 2013
Where Berkeley, USA
Submission Deadline Oct 19, 2012
Notification Due Dec 21, 2012
Final Version Due Feb 21, 2013
Categories    VLSI
 

Call For Papers

The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, debug and repair of microelectronic
circuits and systems. Major topics include, but are not limited to:

• Analog, Mixed-Signal & RF Test
• ATPG & Compression
• ATE Architecture & Software
• Built-In Self-Test (BIST)
• Defect & Current Based Test
• Defect/Fault Tolerance
• Delay & Performance Test
• Design for Testability (DFT)
• Design Verification/Validation
• Diagnosis and Debug
• Embedded System & Board Test
• Embedded Test Methods
• Emerging Technologies Test
• FPGA Test
• Fault Modeling and Simulation
• Hardware Security
• Low-Power IC Test
• Microsystems, MEMS and Sensor Test
• Memory Test and Repair
• On-Line Test & Error Correction
• Power and Thermal Issues in Test
• System-on-Chip (SOC) Test
• Test Standards
• Test Economics
• Test of Biomedical Devices
• Test of High-Speed I/O
• Test Quality and Reliability
• Test Resource Partitioning
• Transients and Soft Errors
• 2.5D, 3D and SiP Test

Related Resources

ASYNC 2018   24st IEEE International Symposium on Asynchronous Circuits and Systems
CGDEIJ 2018   Computer Game Development and Education
ISVLSI 2018   IEEE Computer Society Annual Symposium on VLSI
IPDPS 2018   32nd IEEE International Parallel and Distributed Processing Symposium
IEEE AVSS 2018   IEEE International Conference on Advanced Video and Signal-based Surveillance
MSEJ 2018   Advances in Materials Science and Engineering: An International Journal (MSEJ)
VLSICS 2018   International Journal of VLSI design & Communication Systems
DATE E2 2018   Design, Automation, and Test in Europe, Topic E2: Compilers and Software Synthesis
WACV 2019   IEEE Winter Conf. on Applications of Computer Vision,
IJME 2018   International Journal of Microelectronics Engineering