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DDECS 2013 : 16Th IEEE Symposium On Design And Diagnostics Of Electronic Circuits And Systems


Conference Series : Design and Diagnostics of Electronic Circuits and Systems
When Apr 8, 2013 - Apr 10, 2013
Where Karlovy Vary, Czech Republic
Submission Deadline Jan 8, 2013
Notification Due Feb 25, 2013
Final Version Due Mar 10, 2013
Categories    electronic circuits   systems

Call For Papers


16th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2013)

April 8 - 10, 2013, Karlovy Vary (Carlsbad), Czech Republic

***** Submission deadline *****
January 8th, 2013

DDECS provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems. The Symposium is organized by Brno University of Technology, Faculty of Information Technology, and sponsored by the Test Technology Technical Council (TTTC) of the IEEE Computer Society.

===== Invited Speakers =====

Rolf Drechsler (University of Bremen)
Erik Jan Marinissen (IMEC)
Kaushik Roy (Purdue University)

===== Paper Submission =====

Prospective authors are cordially invited to submit original papers using the electronic submission system at the Symposium web page. Papers in English with a length of 6 pages maximum in IEEE conference style are expected. Accepted papers will be included to the Symposium Proceedings and will be available through the IEEE Xplore Digital Library. Specialized student and industrial sessions, as well as embedded tutorials, will be organized at the symposium.
Proposals for tutorials can also be submitted through the electronic submission system.

===== Topics of interest include but are not limited to =====

* SoC and NoC Design and Test
* ASIC/FPGA Design
* Built-in Self-Test and Self-Repair
* Bio-Inspired Hardware
* Design Verification/Validation
* Formal Methods in System Design
* Hardware/Software Co-Design
* IP-based Design
* Logic Synthesis
* Defect/Fault Tolerance and Reliability
* Design and Test in Nano-Technologies
* Analog, Mixed-Signal, RF Design and Test
* ATE Hardware and Software
* Design for Testability and Diagnosis
* On-line Testing
* Embedded Systems Testing
* Memory, Processor Testing
* MEMS Testing
* Physical Design
* Dependable HW/SW Systems

===== Important Dates =====

Submission deadline: January 8th, 2013
Notification of acceptance: February 25th, 2013
Camera-ready papers: March 10th, 2013

===== Committee =====

General Chair:
Lukas Sekanina, Brno University of Technology, Czech Republic

Program Chair:
Goerschwin Fey, German Aerospace Center, Germany

General Vice-chair:
Jaan Raik, Tallinn University of Technology, Estonia

Program Co-Chair:
Snorre Aunet, Norwegian University of Science and Technology, Norway

Topic Chairs:
Ondrej Novak, Technical University of Liberec, Czech Republic Martin Danek, Academy of Sciences of the Czech Republic, Czech Republic Said Hamdioui, TU Delft, Netherlands

Organizing Committee Chair:
Richard Ruzicka, Brno University of Technology, Czech Republic


More information:
Lukas Sekanina,
Goerschwin Fey,

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