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AIT 2012 : 6th EOS Topical Meeting on Advanced Imaging Techniques


When Jul 2, 2012 - Jul 5, 2012
Where Hyères - Southern Alps, Franc
Submission Deadline Feb 24, 2012
Categories    nearfield methods   nonlinear imaging   exoplanet detection   lithography

Call For Papers

The focus of the Topical Meeting is on those novel techniques that are being developed in order to meet the extensive demands on optical imaging. The meeting will be organised so as to allow intensive discussions and a fruitful exchange of ideas with a single session of presentations and a poster session. Specialised in scope and restricted in number of participants, the Topical Meeting will give you the opportunity to easily establish contacts and to initiate new business relations and research collaborations.

This meeting is the 6th of the EOS Topical Meeting Series on Advanced Imaging Techniques. Former meetings took place in Delft (2003), London (2005), Lille (2007), Jena (2009) and Engelberg (2010).

- Numerical image restoration
- Structured light illumination (SIM)
- Fluorescence superresolution techniques (STORM, FRED, PALM, STED)
- Superresolving pupil-masks
- Nonlinear imaging
- Double and quadruple patterning lithography
- Exoplanet detection
- Advanced nearfield methods (lenlets, metamaterials, ...)
- Superresolution radar

EOS-Events & Services GmbH
Silke Kramprich
(Deputy Executive Director)
Tel.: +49-511-2788-117
Fax: +49-511-2788-119

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