posted by user: barathge || 4151 views || tracked by 7 users: [display]



When Mar 19, 2012 - Mar 21, 2012
Where Kos island, Greece
Submission Deadline Oct 10, 2011
Notification Due Nov 22, 2011
Final Version Due Dec 10, 2011
Categories    model based testing   model driven development   automatic test generation   automation, automotive

Call For Papers

Call for Papers / Invitation to Special Session (IEEE-ICIT 2012)
Special Session Organisers

Barath Kumar
inIT - Institut Industrial IT
Contact:, Web:

Prof. Juergen Jasperneite
Fraunhofer IOSB-INA
Contact:, Web:


IEEE Industrial Electronics Society
University of Patras (UoP), Industrial Systems Institute (ISI), Greece


In a rapidly changing Industrial technology era, higher product quality and faster time to market are key driving forces to success. Increased use of complex industrial software has increased the need for better testing methodologies. Fueled by this need, Model based engineering and testing (MDD & MBT) have evolved as suitable candidates over the last decade to face this challenge, which is evident from MBT’s substantial usage in the field of aerospace, automotive, telecommunication and micro-electronics.

The purpose of this special session is to bring industry and academia under one roof serving as a forum for discussion and exchange of ideas in the context of using Model based testing and engineering in the industrial sector. This special section might also serve as a window for collaboration (e.g. future projects) between the Model-Based testing community and industries like software testing, automation, automotive, telecommunication, etc. promoting MBT’s further usage.

Topics of interest include (but are not limited to):

a)Model based test design and specifications
b)Model based testing and TTCN-3
c)Model based software development for embedded systems
d)Model driven system/protocol engineering
e)Modeling methodologies for testing
f)Model based test generation techniques for Industrial systems (complex systems)
g)Model based diagnosis
h)Hardware-in-the-Loop testing (automation and automotive)
i)Tool automation/simulation and tool support
j)Experience reports on using Model Based Testing

Review Committee members:

Paul Ammann (George Mason University, USA)
Paul Baker (Motorola, UK)
Christof Budnik (Siemens, USA)
Mirko Conrad (Mathworks, USA)
Steve Counsell (Brunel University, UK)
Tibor Csöndes (Ericsson, Hungary)
Zhen Ru Dai (University of Applied Science Hamburg, Germany)
Streitferdt Detlef (Technische Universitaet Ilmenau, Germany)
Robert Eschbach (Fraunhofer IESE, Germany)
Piotr Gaj (Institute of Informatics, Poland)
Robert Hierons (Brunel University, UK)
Antti Huima (Conformiq, USA)
Juergen Jasperneite (Fraunhofer IOSB- INA, Germany)
Ulrich Jumar (ifak – Institute f. Automation u. Kommunikation e.V., Germany)
Victor Kuliamin (Institute for System Programming, Russia)
Barath Kumar (Institut Industrial IT, Germany)
Lan Lin (University of Tennessee, USA)
Brian Nielsen (Aalborg University, Denmark)
Virginia Papailiopoulou (INRIA, France)
Florian Prester (Seppmed, Germany)
Alexander Pretschner (Karlsruhe Institute of Technology, Germany)
Ina Schieferdecker (Fraunhofer FOKUS, Germany)
Alin Stefanescu (University of Pitesti, Romania)
Dragos Truscan (Åbo Akademi University, Finland)
Theofanis Vassiliou-Gioles (Testing Technologies, Germany)
Stefan Wagner (Institute of Software Technology, Germany)
Stephan Weißleder (Fraunhofer FIRST, Germany)
Sebastian Wieczorek (SAP, Germany)
Justyna Zander (Fraunhofer FOKUS, Germany)

Important dates:

Deadline for submission of full paper: 20th October 2011 (Extended deadline)
Notification of acceptance with electronic publication instruction: 22nd November 2011
Deadline for final manuscript: 10th December 2011

Same as for regular papers. All the instructions for paper submission are included in the conference website:

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