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DFT 2023 : 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems


Conference Series : Defect and Fault Tolerance in VLSI and Nanotechnology Systems
When Oct 3, 2023 - Oct 5, 2023
Where Juan-Les-Pins, France
Abstract Registration Due May 5, 2023
Submission Deadline May 12, 2023
Notification Due Jul 14, 2023
Final Version Due Jul 28, 2023
Categories    fault tolerance   VLSI   reliability   testing

Call For Papers

The 2023 edition of the conference will be in presence in Juan-Les-Pins (France) and will be co-located with the European Data Handling & Data Processing Conference (EDHPC 2023) organized by the European Space Agency.

DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI and nanotechnology systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest. Topics include (but are not limited to) the following:

- Yield Analysis and Modeling
- Testing Techniques
- Design For Testability in IC Design
- Error Detection, Correction, and Recovery
- Dependability Analysis and Validation
- Repair, Restructuring and Reconfiguration
- Defect and Fault Tolerance
- Radiation effects
- Aging and Lifetime Reliability
- Dependable Applications and Case Studies
- Emerging Technologies
- Design for Security

Further details are available on the website.

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