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ISSMLE 2023 : International Symposium on Statistics and Machine Learning in Electronics

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Link: https://sites.google.com/view/easmle/symposium
 
When Jun 20, 2023 - Jun 23, 2023
Where Bol and Split, Croatia
Submission Deadline Feb 24, 2023
Notification Due Apr 20, 2023
Final Version Due May 5, 2023
Categories    machine learning   statistics   fuzzy logic   electronics
 

Call For Papers

The International Symposium on Statistics and Machine Learning in Electronics, in the framework of the 8th International Conference on Smart and Sustainable Technologies (SpliTech2023) will be held in hybrid mode in Bol and Split, Croatia, on June 20-23, 2023.
Rationale
The aim of the International Symposium on Statistics and Machine Learning in Electronics is to bring together young and experienced researchers, students and educators with interests in how statistics, machine learning and fuzzy logic could facilitate analysis, design, testing, diagnosis, measurement and manufacturing of electronic circuits, modules and devices. Final scientific results and research in progress will be presented and discussed, revealing new models, methods, algorithms, techniques, and methodologies. The conference is base for forming an international scientific network, spreading new and innovative ideas and the best practices. It will distribute the achieved findings during the project "Exploration Applications of Statistics and Machine Learning in Electronics", financed by National Scientific Fund.
Topics
The topics are related to applications of statistics, machine learning and fuzzy logic methods, algorithms, techniques, methodologies, models in:
§ Electronic circuit design
§ Electronic circuit analysis
§ Electronic circuits and devices testing and diagnosis
§ Electronics circuits and devices measurement
§ Manufacturing of electronic components and devices
§ Electronic process management
§ Quality management in electronics
§ Digital twins

Accepted, and presented papers will be published in the conference proceedings and submitted to IEEE Xplore as well as other Abstracting and Indexing (A&I) databases. Authors of selected best papers will be invited to submit an extended version.

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