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IPOE 2012 : 2012 International Workshop on Image Processing and Optical Engineering

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Link: http://ipoe.icict.net/
 
When Jan 9, 2012 - Jan 10, 2012
Where Harbin,China
Submission Deadline Aug 10, 2011
Notification Due Sep 10, 2011
Final Version Due Sep 25, 2011
Categories    image processing   optical engineering
 

Call For Papers

Image processing and optical engineering are very hot and important research topics and gain more attention by economy as well as society in recent years.The 2012 International Workshop on Image Processing and Optical Engineering (IPOE 2012) will be held from Jan 9~10, 2012 in Harbin, P.R. China.The conference will continue the excellent tradition of gathering world-class researchers, engineers and educators engaged in the fields of Image Processing and Optical Engineering to meet and present their latest activities. You are cordially invited to attend this interesting event.

The idea of the conference is for the scientists, scholars, engineers and students from the Universities all around the world and the industry to present ongoing research activities, and hence to foster research relations between the Universities and the industry. This conference provides opportunities for the delegates to exchange new ideas and application experiences face to face, to establish business or research relations and to find global partners for future collaboration. This conference is co-sponsored by Harbin University of Science and Technology and International Science and Engineering Research Center, and it is technical co-sponsored by Harbin Engineering University,Northeast Forestry University,Harbin Normal University, HeiLongJing University, Northeast Petroleum University and Harbin University.

All accepted papers will be published by SPIE, Which will be indexed by EI Compendex.

Important Dates: Submission Due: Before August 10, 2011
Notification of Acceptance: Before Before September 10, 2011
Registration Due: Before Before September 25, 2011
Conference Date: January 9~10, 2012


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Proceedings of SPIE are among the most cited references in the patent literature, and are indexed in numerous online databases including INSPEC, Ei Compendex, Physics Abstracts, Chemical Abstracts, SPIN, International Aerospace Abstracts, ISI Index to Scientific and Technical Proceedings, and the Smithsonian/NASA Astrophysics Data System Abstract Service (ADS).

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