Dear Colleagues,

It is our great pleasure to invite you to participate in this Special Issue of Computation, named “Applications of Statistics and Machine Learning in Electronics”. It is devoted to better understanding the role of statistics and machine learning in supporting and facilitating a wide variety of engineering tasks in electronics. The Special Issue will publish extended variants of the accepted papers presented at the International Conference on Statistics and Machine Learning in Electronics, but colleagues from all over the world who cannot be a part of the conference are also invited. These papers will follow a rigorous peer-review process to satisfy a high standard of publication.

Statistical methods are utilized in different areas of electronics to model, analyse, and evaluate events, processes, and phenomena. Complex interactions between electronic components, as well as the influence of external or accidental internal factors, can impair the performance of an electronic circuit or device, cause unexpected behaviour and output response, or lead to irreversible damage. Statistical analysis allows malfunctioning components and devices to be thoroughly investigated and corrected. In addition, statistical methods are applied to assess the quality of the manufacturing process, ensuring the production of electronic components and devices that possess characteristics according to technical specifications.

The applications of machine and deep learning in electronics contribute to the study, prediction, and better understanding of the behaviour of electronic circuits and devices. Machine learning algorithms and artificial neural networks can model electronic circuits and solve complex problems. They are also applied in the field of measurement, testing, and diagnostics. Methodologies and models for processing "big data" and building forecasting and analytical models to support decision making and solve engineering problems could be created to implement intelligent electronic systems.

Fuzzy logic implementation in control systems and systems, regulating one or several variables, is also in the scope of the discussion.

The topics of the Special Issue include but are not limited to the following research fields: statistics; machine and deep learning; and fuzzy logic methods, algorithms, techniques, methodologies, and models in:

-Electronic circuit design;
-Electronic circuit analysis;
-Electronic circuit and device testing and diagnosis;
-Electronics circuit and device measurement;
-Manufacturing of electronic components and devices;
-Electronic process management;
-Quality management in electronics;
-Digital twins.

Guest Editors
Prof. Dr. Stefan Hensel
Prof. Dr. Marin B. Marinov
Dr. Malinka Ivanova
Dr. Maya Dimitrova
Dr. Hiroaki Wagatsuma