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CD-MAKE 2022 : Cross Domain Conference for Machine Learning and Knowledge Extraction

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Link: https://cd-make.net/about/
 
When Aug 23, 2022 - Aug 26, 2022
Where Vienna, Austria
Submission Deadline Mar 20, 2022
Notification Due May 1, 2022
Final Version Due Jun 19, 2022
Categories    machine learning   cross domain   computer science
 

Call For Papers


Call for Papers
6th International Cross Domain Conference for
Machine Learning & Knowledge Extraction (CD-MAKE 2022)

CD-MAKE 2022 Call for Papers (txt, pdf)

CD-MAKE is a joint effort of IFIP TC 5, TC 12, IFIP WG 8.4, WG 8.9 and WG 12.9 and is held in conjunction with the 17th International Conference on Availability, Reliability and Security ARES 2022
August 23th – August 26th, 2022.

Depending on the situation related to COVID-19 in 2022 we will keep you updated on regulations regarding the conference. Furthermore, if necessary, we will switch to an all-digital conference.

Machine learning and Knowledge Extraction (MAKE) is the workhorse of Artificial Intelligence (AI). Successful human-centered AI needs a concerted effort without boundaries, supporting collaborative and integrative cross-disciplinary research between experts cross-domain.

The goal of the CD-MAKE conference is to act as a catalysator, to bring together academia and industry in a cross-disciplinary manner, to stimulate fresh ideas and to support human-centered AI:

1) DATA – data fusion, preprocessing, mapping, knowledge representation, environments, etc.
2) LEARNING – algorithms, contextual adaptation, causal reasoning, transfer learning, etc.
3) VISUALIZATION – intelligent interfaces, human-AI interaction, dialogue systems, explanation interfaces, etc.
4) PRIVACY – data protection, safety, security, reliability, verifiability, trust, ethics and social issues, etc.
5) NETWORK – graphical models, graph-based machine learning, Bayesian inference, etc.
6) TOPOLOGY – geometrical machine learning, topological and manifold learning, etc.
7) ENTROPY – time and machine learning, entropy-based learning, etc.

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