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IWCIA 2022 : International Workshop on Combinatorial Image Analysis


Conference Series : International Workshop on Combinatorial Image Analysis
When Jul 13, 2022 - Jul 15, 2022
Where Messina (Italy)
Submission Deadline Mar 14, 2022
Notification Due Apr 15, 2022
Final Version Due Apr 30, 2022
Categories    digital geometry and topology   combinatorics   image analysis   imaging applications

Call For Papers

It is our pleasure to announce the twenty-first International Workshop on Combinatorial Image Analysis that will be held at University of Messina (Italy) on July 13-15, 2022.

The previous workshops were held in Paris (France, 1991), Ube (Japan, 1992), Washington DC (USA, 1994), Lyon (France, 1995), Hiroshima (Japan, 1997), Madras (India, 1999), Caen (France, 2000), Philadelphia (USA, 2001), Palermo (Italy, 2003), Auckland (New Zealand, 2004), Berlin (Germany, 2006), Buffalo, NY (USA, 2008), Playa del Carmen (Mexico, 2009), Madrid (Spain, 2011), Austin (Texas, 2012), Brno (Czech Republic, 2014), Kolkata (India, 2015), Plovdiv (Bulgaria, 2017), Porto (Portugal, 2018), and Novi Sad (Serbia, 2020).

IWCIA 2022 will feature keynote talks, contributed papers, and posters.

Prospective authors are invited to submit a paper on some of the Workshop’s topics or a closely related topic. The submitted work should contain only results that are unpublished and not included in other work considered for publication elsewhere. Thus by submitting a paper the author(s) warrant that neither it nor any other paper with essentially the same technical content has been published or submitted for publication anywhere else.

All manuscripts must be prepared according to LNCS requirements and submitted electronically by March 14, 2022 in PDF format sing the EasyChair platform available at the url
The length should be between 8 and 20 pages. The manuscripts may not contain information revealing authors’ identity.

The contributed papers will be included in the workshop proceedings published by Springer Verlag in Lecture Notes in Computer Science Series.

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