International Journal of Electronic Design and Test(JEDT) Scope and TopicsInternational Journal of Electronic Design and Test(JEDT) is a peer-reviewed, open access journal which invites original works describing the methods used to design and test electronic product hardware and supportive software. Authors from industry and academia are invited to submit their original unpublished research works on the topics listed below:
Topics of interest include but are not limited to, the following - IC/module design
- Low-power design
- Electronic design automation
- Design/test verification
- Fault modelling
- Test generation
- Fault simulation
- Design of testability
- Synthesis of testability
- Built-in self-test
- Test specifications
- Formal verification of hardware
- Simulation for verification
- Design debugging
- Testing of VLSI devices printed circuit boards, and electronic systems
- Testing of analog and digital electronic circuits
- Testing of microprocessors, memories and signal processing devices
- SOC and SIP testing
- Memory and FPGA test and repair
- Delay testing
- IDDQ test
- Novel test methods
- Effectiveness of test methods
- Fault models and ATPG, and DPPM prediction
- DFT for analog/mixed signal ICs and system-on-chip
- DFT and BIST for digital and SoC
Paper SubmissionAuthors are invited to submit papers for this journal through E-mail jedtjournal@airccse.com. Submissions must be original and should not have been published previously or be under consideration for publication while being evaluated for this Journal. Important Dates | Submission Deadline | : | August 27, 2022 | | Authors Notification | : | September 27, 2022 | | Final Manuscript Due | : | October 08, 2022 | | Publication Date | : | Determined by the Editor-in-Chief |
Editor in Chief- Hafizur Rahaman, Indian Institute of Engineering Science and Technology Shibpur, India
Editorial Board Members - Allwyn Clarence, Mepco Schlenk Engineering College, India
- Anand Bajpai, Al Sharq Studies Institute, UAE
- Anand Bulusu, Indian Institute of Technology Roorkee, India
- Angsuman Sarkar, Kalyani Government Engineering College, India
- Ankita Vaish, Babasaheb Bhimrao Ambedkar University, India
- Ashutosh Kumar Dubey, Trinity Institute of Technology & Research, India
- Atefeh Salimi, Isfahan University of Technology, Iran
- Attif ali, Electronics Research Institute, Egypt
- Deepak B.B.V.L, National Institute of Technology, India
- Bal Virdee, London Metropolitan University, UK
- Balwinder Singh, Centre for Development of Advanced Computing (C-DAC), India
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