The aim of this special issue is to present research results related to resolution enhancement of images with the help of pattern recognition applications. Today, Image Processing is one of the most rapidly evolving areas of information technology with growing applications in all areas of business. Successful scientific applications of digital image processing require an intensive interdisciplinary co-operation between the application research area and basic research in image processing itself. Pattern Recognition is a mature, but exciting and fast developing field, which strengthens the developments in cognate fields such as computer vision, image processing, text and document analysis and neural networks.

All contributions to the special issue will be rigorously refereed and are selected on the basis of quality and originality of the work. Because it should equip the researchers, academics, professionals and high level engineering students to understand and manipulate the advanced algorithms. We assure that the special issue will provide a distinct knowledge on the research on Image Processing and its applications. This special issue will accept papers making original contributions to the theory, methodology and application of pattern recognition and image processing area. The special issue will publish the most significant new research papers or any other original contribution in the form of reviews and reports on new concepts in all areas concerning to its scope and research being done in the world, thus ensuring its scientific priority and significance.

Submission instructions:

Manuscripts are invited between 15-07-2021 and 15-12-2021 with the goal of finalizing the Special Issue in APRIL, 2021. All submissions will undergo normal peer-review. All accepted articles will be published immediately. Please ensure to select the appropriate article type “VSI: RIPRA” when submitting your paper.

Important dates:

Submissions will be open from 15-07-2021 to 15-12-2021

This issue will be published virtually to allow all accepted manuscripts to be published without any delay in the first available regular issue. All articles will appear together in under the Special Issue section on the journal’s homepage.

Guest Editor: Dr. R. Cristin, Binu D, James C.N. Yang