posted by system || 1639 views

DBT 2007 : IEEE International Workshop on Current and Defect Based Testing

FacebookTwitterLinkedInGoogle

Link: http://dbt.tttc-events.org/
 
When Oct 25, 2007 - Oct 26, 2007
Where Santa Clara, CA, USA
Abstract Registration Due Aug 18, 2007
Submission Deadline Oct 6, 2007
Categories    computer
 

Call For Papers

[Empty]

Related Resources

CBMS 2026   39th IEEE International Symposium on Computer-Based Medical Systems
IEEE AIxVR 2026   8th International Conference on Artificial Intelligence & extended and Virtual Reality
SANER 2026   The 33rd IEEE International Conference on Software Analysis, Evolution and Reengineering
CIFEr 2026   IEEE Computational Intelligence in Financial Engineering and Economics
SOFSEM 2026   Current Trends in Theory and Practice of Computer Science
ICSICT 2026   2026 IEEE 18th International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
IEEE CCAI 2026   IEEE--2026 6th International Conference on Computer Communication and Artificial Intelligence (CCAI 2026)
IEEE SEAI 2026   2026 IEEE the 6th International Conference on Software Engineering and Artificial Intelligence (SEAI 2026)
IEEE ICCRE 2026   IEEE--2026 11th International Conference on Control and Robotics Engineering (ICCRE 2026)
DFT 2025   38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems