posted by system || 1721 views

DBT 2007 : IEEE International Workshop on Current and Defect Based Testing

FacebookTwitterLinkedInGoogle

Link: http://dbt.tttc-events.org/
 
When Oct 25, 2007 - Oct 26, 2007
Where Santa Clara, CA, USA
Abstract Registration Due Aug 18, 2007
Submission Deadline Oct 6, 2007
Categories    computer
 

Call For Papers

[Empty]

Related Resources

Ei/Scopus-ITCC 2026   2026 6th International Conference on Information Technology and Cloud Computing (ITCC 2026)
IEEE AIxVR 2026   8th International Conference on Artificial Intelligence & extended and Virtual Reality
IEEE ICCT-PACIFIC 2026   2026 IEEE 2nd International Conference on Consumer Technology - Pacific (ICCT-Pacific 2026)
ICAIDS 2026   2026 2nd International Conference on Artificial Intelligence, Digital Media Technology and Social Computing
IEEE-CNML 2026   IEEE 2026 4th International Conference on Communication Networks and Machine Learning
CACML 2026   2026 5th Asia Conference on Algorithms, Computing and Machine Learning (CACML 2026)
Ei/Scopus-CMLDS 2026   2026 3rd International Conference on Computing, Machine Learning and Data Science (CMLDS 2026)
IEEE ICITES 2026   IEEE--2026 6th International Conference on Intelligent Technology and Embedded Systems (ICITES 2026)--SCI
IEEE CH 2026   2026 IEEE International Conference on Cyber Humanities
IEEE CRC 2026   IEEE--2026 11th International Conference on Control, Robotics and Cybernetics (CRC 2026)