posted by user: amamory || 8674 views || tracked by 26 users: [display]

VTS 2011 : IEEE VlSI Test Symposium

FacebookTwitterLinkedInGoogle


Conference Series : VLSI Test Symposium
 
Link: http://www.tttc-vts.org
 
When May 1, 2011 - May 5, 2011
Where Dana Point, USA
Submission Deadline Sep 19, 2010
Notification Due Nov 28, 2010
Categories    VLSI   embedded systems
 

Call For Papers

Major topics include, but are not limited to:

# Analog, Mixed-Signal & RF Test
# ATPG & Compression
# ATE Architecture & Software
# Board & System Test
# Built-In Self-Test (BIST)
# Current Based Test
# Defect/Fault Tolerance & Self-Repair
# Delay & Performance Test
# Design for Testability (DFT)
# Design Verification/Validation
# Diagnosis and Debug
# Embedded System and Microsystems Test
# Embedded Test Methods
# Emerging Technologies Test
# FPGA Test
# Fault Modeling and Simulation
# Infrastructure IP
# Low-Power IC Test
# MEMS And Sensor Test
# Memory Test and Repair
# On-Line Test
# Power Issues in Test
# System-on-Chip (SOC) Test
# System-in-Package Test
# Standards
# Test Economics
# Thermal Test
# Test of Biomedical Devices
# Test of High-Speed I/O
# Test Quality and Reliability
# Test Resource Partitioning
# Transients & Soft Errors

Related Resources

VTS 2021   39th IEEE VLSI Test Symposium
BES 2021   5th International Conference on Biomedical Engineering and Science
DATE 2021   Design, Automation and Test in Europe Conference
CST 2021   8th International Conference on Foundations of Computer Science & Technology
ICDM 2021   21st IEEE International Conference on Data Mining
CSIA 2021   12th International Conference on Communications Security & Information Assurance
IJGCA 2021   International Journal of Grid Computing & Applications
ICMLA 2021   20th IEEE International Conference on Machine Learning and Applications
CTCM 2021   7th International Conference of Control Theory and Computer Modelling
VLSICS 2021   International Journal of VLSI design & Communication Systems