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VTS 2011 : IEEE VlSI Test Symposium

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Conference Series : VLSI Test Symposium
 
Link: http://www.tttc-vts.org
 
When May 1, 2011 - May 5, 2011
Where Dana Point, USA
Submission Deadline Sep 19, 2010
Notification Due Nov 28, 2010
Categories    VLSI   embedded systems
 

Call For Papers

Major topics include, but are not limited to:

# Analog, Mixed-Signal & RF Test
# ATPG & Compression
# ATE Architecture & Software
# Board & System Test
# Built-In Self-Test (BIST)
# Current Based Test
# Defect/Fault Tolerance & Self-Repair
# Delay & Performance Test
# Design for Testability (DFT)
# Design Verification/Validation
# Diagnosis and Debug
# Embedded System and Microsystems Test
# Embedded Test Methods
# Emerging Technologies Test
# FPGA Test
# Fault Modeling and Simulation
# Infrastructure IP
# Low-Power IC Test
# MEMS And Sensor Test
# Memory Test and Repair
# On-Line Test
# Power Issues in Test
# System-on-Chip (SOC) Test
# System-in-Package Test
# Standards
# Test Economics
# Thermal Test
# Test of Biomedical Devices
# Test of High-Speed I/O
# Test Quality and Reliability
# Test Resource Partitioning
# Transients & Soft Errors

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