posted by user: amamory || 7887 views || tracked by 26 users: [display]

VTS 2011 : IEEE VlSI Test Symposium

FacebookTwitterLinkedInGoogle


Conference Series : VLSI Test Symposium
 
Link: http://www.tttc-vts.org
 
When May 1, 2011 - May 5, 2011
Where Dana Point, USA
Submission Deadline Sep 19, 2010
Notification Due Nov 28, 2010
Categories    VLSI   embedded systems
 

Call For Papers

Major topics include, but are not limited to:

# Analog, Mixed-Signal & RF Test
# ATPG & Compression
# ATE Architecture & Software
# Board & System Test
# Built-In Self-Test (BIST)
# Current Based Test
# Defect/Fault Tolerance & Self-Repair
# Delay & Performance Test
# Design for Testability (DFT)
# Design Verification/Validation
# Diagnosis and Debug
# Embedded System and Microsystems Test
# Embedded Test Methods
# Emerging Technologies Test
# FPGA Test
# Fault Modeling and Simulation
# Infrastructure IP
# Low-Power IC Test
# MEMS And Sensor Test
# Memory Test and Repair
# On-Line Test
# Power Issues in Test
# System-on-Chip (SOC) Test
# System-in-Package Test
# Standards
# Test Economics
# Thermal Test
# Test of Biomedical Devices
# Test of High-Speed I/O
# Test Quality and Reliability
# Test Resource Partitioning
# Transients & Soft Errors

Related Resources

VTS 2020   IEEE VLSI Test Symposium
SenSys 2020   The 18th ACM Conference on Embedded Networked Sensor Systems
VDAT 2020   24th International Symposium on VLSI Design and Test
MathSJ 2020   Applied Mathematics and Sciences: An International Journal
DATE 2020   Design, Automation, and Test in Europe
ICARA--IEEE, Ei, Scopus 2021   IEEE--2020 7th International Conference on Automation, Robotics and Applications (ICARA 2020)--Ei Compendex, Scopus
DSD 2020   Euromicro Conference on Digital System Design (DSD) 2020
IEEE-CC 2020   First IEEE International Conference on Conversational Computing
AIKE 2020   IEEE Artificial Intelligence & Knowledge Engineering 2020