COMPSAC
www.compsac.org

Computationally Smart Environments

COMPSAC, the IEEE Signature Conference on Computers, Software & Applications , is one of the major international forums for academia, industry and government to discuss research results, advances and future trends in computer and software technologies and applications. The technical program includes keynote addresses, research papers, industrial case studies, panel discussions and fast abstracts. It also includes a number of workshops on emerging important topics. The theme for COMPSAC 2010 is Computationally Smart Environments.

Smart software solutions applied to diverse areas (including but not limited to Healthcare, Energy, Social, Environmental, Industrial applications, etc...) can improve efficiency, reliability, quality and simultaneously reduce costs. Requirement analysis, co-analysis/co-design, modelling, development, testing, measurement, verification, validation, performance, autonomy, safety, security and dependability constraints are a few of numerous computing disciplines that can collectively contribute to these smart solutions and are some of the topics of interest. The program of COMPSAC 2010 will continue to feature research and industrial practice papers with a wide range of topics, focusing on software and middleware development for distributed platforms, services computing, cloud computing and mobile systems. The program is not limited to these topics. Interdisciplinary submissions are also encouraged.

To properly engineer smart solutions, the foundations, methodologies, and mechanisms that support the design, modelling, and evaluation of software systems and computer applications must come from diverse sources. Multidisciplinary work, research and development of software prototypes, industry-university collaborations, all based on new emerging and critical technologies will be of particular interest to this conference. All accepted papers will be published in the electronic proceedings by the IEEE Computer Society, indexed through INSPEC and EI Index and automatic inclusion in the IEEE digital library.