IOLTS 2025

The 31st IEEE International Symposium on On-Line Testing and Robust System Design
7-9 July 2025, Ischia, Italy

Key Dates
Submission of title, abstract, and authors: February 23, 2025
Final Paper Submission: March 2, 2025
Author Notification: April 18, 2025
Camera-ready paper and author registration: May 25, 2025
Conference Dates: July 7 - 9, 2025


The IEEE International Symposium on On-Line Testing and Robust System Design explores emerging trends and novel concepts related to all aspects of the robustness of microelectronic circuits and systems.

The 2025 edition of IOLTS will be a full in-person event organized in Ischia island (Naples region), Italy, from July 7 to July 9, 2025.

You are invited to participate and submit your contributions to IOLTS’25.
The areas of interest include (but are not limited to) the following topics:

Dependable system design
Dependable Computer Architectures
Design-for-Reliability
Design for Reliability approaches for Low-Power
Cross-layer reliability approaches
Fault-Tolerant and Fail-Safe systems
Functional safety
Self-Test and Self-Repair
Self-Healing design
Self-Regulating design
Self-Adapting design
Reliability issues of Low-Power Design
Robustness evaluation
Quality, yield, reliability, and lifespan issues in nanometer technologies
Variability, Aging, EMI, and Radiation Effects in nanometer technologies
On-line testing techniques for digital, analog, and mixed-signal circuits
Self-checking circuits and coding theory
On-line monitoring of current, temperature, process variations, and aging
Power density and overheating issues in nanometer technologies
Field Diagnosis, Maintainability, and Reconfiguration
Design for Security
Fault-based attacks and countermeasures
Design for Robustness for automotive, railway, avionics, space, large industrial applications, IT infrastructure, cloud computing, and wired, cellular, and satellite communications
CAD for robust circuits design