|
|
|
| |||||||||||||||
WRTLT 2009 : IEEE Tenthl Workshop on Register Transfer Level and High Level Testing | |||||||||||||||
| Link: http://conferences.cse.cuhk.edu.hk/wrtlt09/ | |||||||||||||||
| |||||||||||||||
Call For Papers | |||||||||||||||
|
The purpose of this workshop is to bring researchers and practitioners on LSI testing from all over the world together to exchange ideas and experiences on register transfer level (RTL) and high level testing.
Key Dates Submission: Aug.4th, 09 Acceptance: Sep.11th, 09 Camera R: Oct.10th, 09 Workshop: Nov.27th-28th, 09 WRTLT Topics Areas of interest include but are not limited to: - Functional fault modeling - RTL ATPG - Microprocessor testing - RTL BIST - Relationship between RTL and gate level testing - Design verification - High level test bench generation - SoC testing - High level approaches for testing - RTL DFT |
|
