posted by system || 1826 views

DBT 2007 : IEEE International Workshop on Current and Defect Based Testing

FacebookTwitterLinkedInGoogle

Link: http://dbt.tttc-events.org/
 
When Oct 25, 2007 - Oct 26, 2007
Where Santa Clara, CA, USA
Abstract Registration Due Aug 18, 2007
Submission Deadline Oct 6, 2007
Categories    computer
 

Call For Papers

[Empty]

Related Resources

Ei/Scopus-AI2A 2026   2026 6th International Conference on Artificial Intelligence, Automation and Algorithms (AI2A 2026)
AIAAT 2026   2026 7th International Conference on Artificial Intelligence Applications and Technologies (AIAAT 2026)
IEEE AIxVR 2026   8th International Conference on Artificial Intelligence & extended and Virtual Reality
ICEECE 2026   2026 IEEE International Conference on Electrical Electronic and Computer Engineering (ICEECE)
IEEE SSCI 2027   2027 IEEE Symposium Series on Computational Intelligence
IEEE ICCT-PACIFIC 2026   2026 IEEE 2nd International Conference on Consumer Technology - Pacific (ICCT-Pacific 2026)
Ei/Scopus-ACEPE 2026   2026 3rd IEEE Asia Conference on Advances in Electrical and Power Engineering (ACEPE 2026)
IEEE-DSIT 2026   2026 IEEE 9th International Conference on Data Science and Information Technology
Evidence-Based mHealth 2026   Evidence-Based mHealth: A Researcher’s Guide to Designing, Testing and Validating Digital Health Apps
IEEE ICIT 2027   28th IEEE Conference on Industrial Technology