posted by system || 1813 views

DBT 2007 : IEEE International Workshop on Current and Defect Based Testing

FacebookTwitterLinkedInGoogle

Link: http://dbt.tttc-events.org/
 
When Oct 25, 2007 - Oct 26, 2007
Where Santa Clara, CA, USA
Abstract Registration Due Aug 18, 2007
Submission Deadline Oct 6, 2007
Categories    computer
 

Call For Papers

[Empty]

Related Resources

IEEE AIxVR 2026   8th International Conference on Artificial Intelligence & extended and Virtual Reality
AIAAT 2026   2026 7th International Conference on Artificial Intelligence Applications and Technologies (AIAAT 2026)
IEEE ICCT-PACIFIC 2026   2026 IEEE 2nd International Conference on Consumer Technology - Pacific (ICCT-Pacific 2026)
ICEECE 2026   2026 IEEE International Conference on Electrical Electronic and Computer Engineering (ICEECE)
IEEE-ISSE 2026   2026 IEEE International Conference on Intelligent Information, Systems Science and Engineering (ISSE 2026)
Ei/Scopus-ACEPE 2026   2026 3rd IEEE Asia Conference on Advances in Electrical and Power Engineering (ACEPE 2026)
IEEE ICIT 2027   28th IEEE Conference on Industrial Technology
IEEE ICEIT 2027   IEEE--2027 the 16th International Conference on Educational and Information Technology (ICEIT 2027)
PSETC 2026   2026 2nd IEEE International Power and Sustainable Energy Technologies Conference
AAIML 2027   IEEE--2027 2nd International Conference on Advances in Artificial Intelligence and Machine Learning