Home Categories
CFPs Conf Series
My List
My Archive
On iPhone
On Android
posted by system || 1552 views

DBT 2007 : IEEE International Workshop on Current and Defect Based Testing

FacebookTwitterLinkedInGoogle

Link: http://dbt.tttc-events.org/
 
When Oct 25, 2007 - Oct 26, 2007
Where Santa Clara, CA, USA
Abstract Registration Due Aug 18, 2007
Submission Deadline Oct 6, 2007
Categories    computer
 

Call For Papers

[Empty]

Related Resources

IJGCA 2025   International Journal of Grid Computing & Applications
CCEAI 2026   2026 10th International Conference on Control Engineering and Artificial Intelligence (CCEAI 2026)
SANER 2026   The 33rd IEEE International Conference on Software Analysis, Evolution and Reengineering
lisbon- CMVIT 2026   2026 10th International Conference on Machine Vision and Information Technology (CMVIT 2026)
CIFEr 2026   IEEE Computational Intelligence in Financial Engineering and Economics
Portugal-CMVIT 2026   2026 10th International Conference on Machine Vision and Information Technology (CMVIT 2026)
BIBE 2025   The 25th IEEE International Conference on Bioinformatics and Bioengineering
BigData 2025   2025 IEEE International Conference on Big Data
IEEE CAIT 2025   IEEE--2025 6th International Conference on Computers and Artificial Intelligence Technology (CAIT 2025)
ICCBR 2025   33rd International Conference on Case-based Reasoning
About Us | Contact Us | Data | Privacy Policy | Terms and Conditions
Partners: AI2's Semantic Scholar
This wiki is licensed under a Creative Commons Attribution-Share Alike 3.0 License.