posted by system || 1741 views

DBT 2007 : IEEE International Workshop on Current and Defect Based Testing

FacebookTwitterLinkedInGoogle

Link: http://dbt.tttc-events.org/
 
When Oct 25, 2007 - Oct 26, 2007
Where Santa Clara, CA, USA
Abstract Registration Due Aug 18, 2007
Submission Deadline Oct 6, 2007
Categories    computer
 

Call For Papers

[Empty]

Related Resources

Ei/Scopus-ITCC 2026   2026 6th International Conference on Information Technology and Cloud Computing (ITCC 2026)
AIAAT 2026   2026 7th International Conference on Artificial Intelligence Applications and Technologies (AIAAT 2026)
IEEE-ICECCS 2026   2025 IEEE International Conference on Electronics, Communications and Computer Science (ICECCS 2026)
IEEE AIxVR 2026   8th International Conference on Artificial Intelligence & extended and Virtual Reality
IEEE ICCT-PACIFIC 2026   2026 IEEE 2nd International Conference on Consumer Technology - Pacific (ICCT-Pacific 2026)
IEEE-Ei/Scopus-ICISC 2026   2025 6th International Conference on Intelligent System and Computing (ICISC 2026)
CACML 2026   2026 5th Asia Conference on Algorithms, Computing and Machine Learning (CACML 2026)
IEEE CSCloud 2026   The 13th IEEE International Conference on Cyber Security and Cloud Computing
IEEE ICITES 2026   IEEE--2026 6th International Conference on Intelligent Technology and Embedded Systems (ICITES 2026)--SCI
Ei/Scopus-CMLDS 2026   2026 3rd International Conference on Computing, Machine Learning and Data Science (CMLDS 2026)