posted by user: xgeorgio || 6159 views || tracked by 7 users: [display]

ASTR 2011 : IEEE/CPMT TC-7 Workshop on Accelerated Stress Testing & Reliability

FacebookTwitterLinkedInGoogle

Link: http://www.ewh.ieee.org/soc/cpmt/tc7/ast2011/
 
When Oct 12, 2011 - Oct 14, 2011
Where San Francisco, USA
Submission Deadline Mar 15, 2011
Notification Due Apr 15, 2011
Final Version Due May 20, 2011
Categories    stress testing   reliability
 

Call For Papers

[Empty]

Related Resources

IJWesT 2026   International Journal of Web & Semantic Technology
IEEE ICVARS 2026   IEEE--2026 10th International Conference on Intelligent Computing and Virtual & Augmented Reality Simulations (ICVARS 2026)
AIChE Spring Meeting & GCPS 2026   2026 AIChE Spring Meeting & 22nd Global Congress on Process Safety
MEC 2026   10th International Conference on Trends in Mechanical Engineering
TC 2026   47th Translating and the Computer Conference
IEEE ICSRS 2026   IEEE--2026 The 10th International Conference on System Reliability and Safety (ICSRS 2026)
IJME 2026   International Journal of Microelectronics Engineering
IEEE ICRE 2026   IEEE--2026 10th International Conference on Reliability Engineering (ICRE 2026)
Science & Religion Forum 2026   Data, Laws & Evidence: Philosophy of Science in Dialogue with religious Thought
ICMFM 2027   Springer--2027 6th International Conference on Materials Engineering and Functional Materials (ICMFM 2027)