DFT: Defect and Fault Tolerance in VLSI and Nanotechnology Systems

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Past:   Proceedings on DBLP

Future:  Post a CFP for 2024 or later   |   Invite the Organizers Email

 
 

All CFPs on WikiCFP

Event When Where Deadline
DFT 2023 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Oct 3, 2023 - Oct 5, 2023 Juan-Les-Pins, France May 12, 2023 (May 5, 2023)
DFT 2022 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, October 2022, USA
Oct 3, 2022 - Oct 5, 2022 Austin, Texas, USA Jun 3, 2022
DFT 2019 IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Oct 2, 2019 - Oct 4, 2019 ESA-ESTEC & TU Delft, Netherlands May 17, 2019 (May 3, 2019)
DFT 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Oct 8, 2018 - Oct 10, 2018 Chicago, IL, USA May 18, 2018 (May 4, 2018)
DFT 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Oct 3, 2011 - Oct 5, 2011 Vancouver, Canada May 14, 2011
DFT 2008 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
May 7, 2008 - Oct 3, 2008 Cambridge, MA, USA Jul 14, 2008
 
 

Present CFP : 2023

The 2023 edition of the conference will be in presence in Juan-Les-Pins (France) and will be co-located with the European Data Handling & Data Processing Conference (EDHPC 2023) organized by the European Space Agency.

DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI and nanotechnology systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest. Topics include (but are not limited to) the following:

- Yield Analysis and Modeling
- Testing Techniques
- Design For Testability in IC Design
- Error Detection, Correction, and Recovery
- Dependability Analysis and Validation
- Repair, Restructuring and Reconfiguration
- Defect and Fault Tolerance
- Radiation effects
- Aging and Lifetime Reliability
- Dependable Applications and Case Studies
- Emerging Technologies
- Design for Security


Further details are available on the website.


 

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