The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs. With the continuing push to smaller technology and increased complexity in design and test of ICs and systems, the 20th NATW will feature: "Drive to Nanoscale".

We encourage student participation by presenting a Best Student Paper Award.

For general information, contact:
Dr. Martin Margala, General Chair
University of Massachusetts Lowell
Phone: (978)934-2986
Email: martin_margala @ uml.edu

For program information, contact:
Dr. Jennifer Dworak, Program Chair
Southern Methodist University
Phone: (214)768-1092
Email: jdworak @ smu.com